Characterization of soft errors caused by single event upsets in CMOS processes, IEEE Transactions on Dependable and Secure Computing, vol.1, issue.2, pp.128-143, 2004. ,
DOI : 10.1109/TDSC.2004.14
Early Analysis of Fault-based Attack Effects in Secure Circuits, IEEE Transactions on Computers, vol.56, issue.10, pp.1431-1434, 2007. ,
DOI : 10.1109/TC.2007.1078
URL : https://hal.archives-ouvertes.fr/hal-00178989
Using built-in sensors to cope with long duration transient faults in future technologies, 2007 IEEE International Test Conference, pp.1-10, 2007. ,
DOI : 10.1109/TEST.2007.4437631
Transient Error Detection and Recovery in Processor Pipelines, 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp.304-312, 2009. ,
DOI : 10.1109/DFT.2009.38
Using Bulk Built-in Current Sensors to Detect Soft Errors, IEEE Micro, vol.26, issue.5, pp.10-18, 2006. ,
DOI : 10.1109/MM.2006.103
Tbulk-BICS: A Built-In Current Sensor Robust to Process and Temperature Variations for Soft Error Detection, IEEE Transactions on Nuclear Science, vol.55, issue.4, pp.2281-2288, 2008. ,
DOI : 10.1109/TNS.2008.920426
A novel built-in current sensor for I/sub DDQ/ testing of deep submicron CMOS ICs, Proceedings of 14th VLSI Test Symposium, pp.118-123, 1996. ,
DOI : 10.1109/VTEST.1996.510845
Design of static CMOS self-checking circuits using built-in current sensing, [1992] Digest of Papers. FTCS-22: The Twenty-Second International Symposium on Fault-Tolerant Computing, pp.104-111, 1992. ,
DOI : 10.1109/FTCS.1992.243610
SEU-tolerant SRAM design based on current monitoring, Proceedings of IEEE 24th International Symposium on Fault- Tolerant Computing, pp.106-115, 1994. ,
DOI : 10.1109/FTCS.1994.315652
URL : https://hal.archives-ouvertes.fr/hal-00013937
An Efficient BICS Design for SEUs Detection and Correction in Semiconductor Memories, Proc. DATE, IEEE, pp.592-597, 2005. ,
URL : https://hal.archives-ouvertes.fr/hal-00181657
A soft error monitor using switching current detection, 2005 International Conference on Computer Design, pp.185-190, 2005. ,
DOI : 10.1109/ICCD.2005.15
Variation-tolerant hierarchical voltage monitoring circuit for soft error detection, 2009 10th International Symposium on Quality of Electronic Design, pp.799-805, 2009. ,
DOI : 10.1109/ISQED.2009.4810395
Bulk built in current sensors for single event transient detection in deep-submicron technologies, Microelectronics Reliability, vol.48, issue.5, pp.710-715, 2008. ,
DOI : 10.1016/j.microrel.2008.01.002
How to sample results of concurrent error detection schemes in transient fault scenarios?, 2011 12th European Conference on Radiation and Its Effects on Components and Systems, pp.635-642, 2011. ,
DOI : 10.1109/RADECS.2011.6131361
URL : https://hal.archives-ouvertes.fr/lirmm-00701776
A new bulk bult-in current sensing circuit for single-event transient detection, Proc. CCECE, IEEE, pp.1-4, 2010. ,