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Patents Year : 2008

System and Method for Wirelessly Testing Integrated Circuits

Abstract

A system and method for wirelessly testing integrated circuits provides a multiple layer interface to wirelessly test integrated circuits. A wireless testing structure for an integrated circuit comprises a wireless transceiver and a wireless test interface. The wireless transceiver is configured to receive test information from a tester and transmit test result information to the tester. The wireless test interface is configured to interface between the wireless transceiver and the integrated circuit. The wireless test interface comprises a media access controller and a test control block. The media access controller is configured to implement a media access control protocol for wireless communication. The test control block is configured to decode test information received from the tester, to trigger a test of the integrated circuit in response to the decoded test information, and to encode test result information that is generated by the integrated circuit in response to the test.
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Dates and versions

lirmm-00767777 , version 1 (20-12-2012)

Identifiers

  • HAL Id : lirmm-00767777 , version 1

Cite

David Andreu, Philippe Cauvet, Marie-Lise Flottes, Ziad Noun, Serge Bernard. System and Method for Wirelessly Testing Integrated Circuits. Spain, Patent n° : EP 08290891 WO 2010031879 (A1). 2008, pp.N/A. ⟨lirmm-00767777⟩
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