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Book Sections Year : 2010

Models for Power-Aware Testing


Power consumption of circuits and systems receives more and more attention. In test mode, power consumption is even more critical than in system model and has severe impact on reliability, yield and test costs. This chapter describes the different types and sources of test power. Power-aware techniques for test pattern generation, design for test and test data compression are presented which allow efficient power constrained testing with minimized hardware cost and test application time.
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lirmm-00799927 , version 1 (12-03-2013)


  • HAL Id : lirmm-00799927 , version 1


Patrick Girard, Hans-Joachim Wunderlich. Models for Power-Aware Testing. Wunderlich, Hans-Joachim. Models in Hardware Testing - Lecture Notes of the Forum in honor of Christian Landrault, 43, Springer Netherlands, pp.187-215, 2010, Frontiers in Electronic Testing, 978-90-481-3281-2. ⟨lirmm-00799927⟩
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