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Neutron-Induced Failure in Super-Junction, IGBT, and SiC Power Devices Alessio Griffoni 621831-0 Jeroen van Duivenbode 699572-0 Dimitri Linten 621829-0 Eddy Simoen 699573-0 Paolo Rech 59fd8fedf1b45fdc9a475f2f682658ab lirmm.fr 938758 509741-938758 Luigi Dilillo 91b6da8421e1a299e00bf5311da76a1d lirmm.fr luigi-dilillo 172470 17660-172470 https://www.idref.fr/18891885X https://orcid.org/0000-0002-1295-2688 Frédéric Wrobel 0d44b635da46944e0abf02e8d2683544 ies.univ-montp2.fr frederic-wrobel 11044 17659-11044 https://orcid.org/0000-0002-2437-1223 https://www.idref.fr/069697027 Patrick Verbist 699574-0 Guido Groeseneken 629704-0 Luigi Dilillo 91b6da8421e1a299e00bf5311da76a1d lirmm.fr 2013-03-27 16:13:05 2011 2026-02-12 03:25:37 2013-04-03 13:51:14 2011-09-19 contributor Luigi Dilillo 91b6da8421e1a299e00bf5311da76a1d lirmm.fr CCSD lirmm-00805339 https://hal-lirmm.ccsd.cnrs.fr/lirmm-00805339 griffoni:lirmm-00805339 <i>RADECS: Radiation and Its Effects on Components and Systems</i>, Sep 2011, Seville, Spain. pp.226-231, <a target="_blank" href="https://dx.doi.org/10.1109/RADECS.2011.6131395">⟨10.1109/RADECS.2011.6131395⟩</a> RADECS: Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.226-231, ⟨10.1109/RADECS.2011.6131395⟩ CNRS - Centre national de la recherche scientifique Institut d'Electronique et des Systèmes SysMic Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier MIC Département Microélectronique Mathématiques, Informatique, Physique et Systèmes Université de Montpellier Université de Montpellier (2015-2021) TEST3-HALCNRS International No No Yes Yes Neutron-Induced Failure in Super-Junction, IGBT, and SiC Power Devices Alessio Griffoni 621831-0 Jeroen van Duivenbode 699572-0 Dimitri Linten 621829-0 Eddy Simoen 699573-0 Paolo Rech 59fd8fedf1b45fdc9a475f2f682658ab lirmm.fr 938758 509741-938758 Luigi Dilillo 91b6da8421e1a299e00bf5311da76a1d lirmm.fr luigi-dilillo 172470 17660-172470 https://www.idref.fr/18891885X https://orcid.org/0000-0002-1295-2688 Frédéric Wrobel 0d44b635da46944e0abf02e8d2683544 ies.univ-montp2.fr frederic-wrobel 11044 17659-11044 https://orcid.org/0000-0002-2437-1223 https://www.idref.fr/069697027 Patrick Verbist 699574-0 Guido Groeseneken 629704-0 RADECS: Radiation and Its Effects on Components and Systems 2011-09-19 2011-09-23 Seville Spain IEEE 226-231 2011 10.1109/RADECS.2011.6131395 http://www.radecs2011.org/ English super-junction power MOSFET neutrons Single Event Gate Rupture (SEGR) Single Event Silicon Carbide (SiC) Insulated Gate Bipolar Transistor (IGBT) Burnout (SEB) Engineering Sciences [physics]/Electronics Conference papers Conference papers Conference papers

We investigate the occurrence of Multiple Bit Upsets in commercial SRAMs of 4Mbits and 32Mbits when irradiated with neutrons. The devices were irradiated at TSL facility with QMN beams of energies from 50MeV to 180MeV. Experimental data demonstrate that the dynamic-stress increases SRAMs sensitivity as well as MBUs occurrence for both the memory types. We also show that both SEU and MBU cross section may depend on memory architecture and memory utilization.

0000 0001 2215 0390 https://ror.org/02kcbn207 Interuniversity Microelectronics Centre imec 1984-01-01

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https://www.imec-int.com/en Electromechanics and Power Electronics

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Conception et Test de Systèmes MICroélectroniques SysMIC

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03247508X 0000 0004 0398 8763 https://ror.org/02c2kyt77 Q280824 Eindhoven University of Technology [Eindhoven] TU/e

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https://www.tue.nl/ 139590827 0000000405990488 199111950H https://ror.org/013yean28 Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier LIRMM 1995-01-01 2021-12-31

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