Dynamic-Stress Neutrons Test of Commercial SRAMs - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2011

Dynamic-Stress Neutrons Test of Commercial SRAMs

Abstract

We present a new dynamic test protocol for stressing irradiated commercially available SRAMs. Experimental results attest that cell-level stress must be applied to measure an accurate neutron-induced error rate of devices under working conditions.

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Electronics
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Dates and versions

lirmm-00805349 , version 1 (27-03-2013)

Identifiers

  • HAL Id : lirmm-00805349 , version 1

Cite

Paolo Rech, Jean-Marc J.-M. Galliere, Patrick Girard, Frédéric Wrobel, Frédéric Saigné, et al.. Dynamic-Stress Neutrons Test of Commercial SRAMs. IEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4. ⟨lirmm-00805349⟩
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