Conference Poster
Year : 2012
Arnaud Virazel : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806795
Submitted on : Tuesday, April 2, 2013-1:20:45 PM
Last modification on : Friday, March 24, 2023-2:52:57 PM
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- HAL Id : lirmm-00806795 , version 1
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Carolina Momo Metzler, Aida Todri-Sanial, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, et al.. Resistive Open Defect Analysis for Through-Silicon-Vias. ETS: European Test Symposium, May 2012, Annecy, France. 17th IEEE European Test Symposium, pp.183, 2012. ⟨lirmm-00806795⟩
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