Resistive-Open Defects Affecting Bit-Line Selection in TAS-MRAM Architectures - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2012

Resistive-Open Defects Affecting Bit-Line Selection in TAS-MRAM Architectures

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Micro and nanotechnologies/Microelectronics

Arnaud Virazel  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806827

Submitted on : Tuesday, April 2, 2013-2:37:52 PM

Last modification on : Friday, March 24, 2023-2:52:57 PM

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lirmm-00806827 , version 1 (02-04-2013)

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  • HAL Id : lirmm-00806827 , version 1

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João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Resistive-Open Defects Affecting Bit-Line Selection in TAS-MRAM Architectures. JNRDM: Journées Nationales du Réseau Doctoral en Microélectronique, 2012, Paris, France. ⟨lirmm-00806827⟩

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