Defect Localization Through an Effect-Cause based Intra-Cell Diagnosis - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2012

Defect Localization Through an Effect-Cause based Intra-Cell Diagnosis

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Micro and nanotechnologies/Microelectronics

Arnaud Virazel  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806841

Submitted on : Tuesday, April 2, 2013-2:49:34 PM

Last modification on : Friday, March 24, 2023-2:52:57 PM

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lirmm-00806841 , version 1 (02-04-2013)

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  • HAL Id : lirmm-00806841 , version 1

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Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Defect Localization Through an Effect-Cause based Intra-Cell Diagnosis. Colloque GDR SoC-SiP, 2012, Paris, France. ⟨lirmm-00806841⟩

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