Defect Localization Through an Effect-Cause based Intra-Cell Diagnosis

Zhenzhou Sun 1 Alberto Bosio 1 Luigi Dilillo 1 Patrick Girard 1 Aida Todri-Sanial 1 Arnaud Virazel 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806841
Contributor : Arnaud Virazel <>
Submitted on : Tuesday, April 2, 2013 - 2:49:34 PM
Last modification on : Wednesday, December 11, 2019 - 1:32:02 AM

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  • HAL Id : lirmm-00806841, version 1

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Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Defect Localization Through an Effect-Cause based Intra-Cell Diagnosis. Colloque GDR SoC-SiP, 2012, Paris, France. ⟨lirmm-00806841⟩

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