Conference Papers
Year : 2012
Arnaud Virazel : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806841
Submitted on : Tuesday, April 2, 2013-2:49:34 PM
Last modification on : Friday, March 24, 2023-2:52:57 PM
Dates and versions
Identifiers
- HAL Id : lirmm-00806841 , version 1
Cite
Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Defect Localization Through an Effect-Cause based Intra-Cell Diagnosis. Colloque GDR SoC-SiP, 2012, Paris, France. ⟨lirmm-00806841⟩
Collections
111
View
0
Download