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 Dynamic Mode Testing of SRAMS under Neutron Radiation Georgios Tsiligiannis 380a43881ac7fd0e28980fc41132b360 lirmm.fr 938500 527273-938500 https://orcid.org/0000-0002-8976-559X Luigi Dilillo 91b6da8421e1a299e00bf5311da76a1d lirmm.fr luigi-dilillo 172470 17660-172470 https://www.idref.fr/18891885X https://orcid.org/0000-0002-1295-2688 Alberto Bosio d520d64169c259e699ff959bd1bfad6f ec-lyon.fr alberto-bosio 172965 17774-172965 https://orcid.org/0000-0001-6116-7339 https://www.idref.fr/174383592 Patrick Girard 64eced688a71c917544572f77f24aa3d lirmm.fr patrick-girard-lirmm 740458 52018-740458 https://orcid.org/0000-0003-0722-8772 Aida Todri-Sanial 940978124f8251d4bd025a25619d2a65 lirmm.fr todri 6348 28421-6348 http://www.researcherid.com/rid/M-5156-2013 https://orcid.org/0000-0001-8573-2910 https://scholar.google.fr/citations?user=-awivq4AAAAJ&hl=en https://www.idref.fr/235598879 http://www.researcherid.com/rid/http://www.researcherid.com/rid/M-5156-2013 Arnaud Virazel 514b9bdb53dacba2fd794d9140b751ae lirmm.fr arnaud-virazel 18065 17611-18065 https://www.idref.fr/068454724 http://isni.org/isni/0000000139422532 https://orcid.org/0000-0001-7398-7107 Luigi Dilillo 91b6da8421e1a299e00bf5311da76a1d lirmm.fr 2013-04-02 20:49:19 2012 2023-03-24 14:52:57 2013-04-03 12:33:56 2012-06-13 contributor Luigi Dilillo 91b6da8421e1a299e00bf5311da76a1d lirmm.fr CCSD lirmm-00807053 https://hal-lirmm.ccsd.cnrs.fr/lirmm-00807053 tsiligiannis:lirmm-00807053 <i>Sixième colloque du GDR SOC-SIP du CNRS</i>, Jun 2012, Paris, France Sixième colloque du GDR SOC-SIP du CNRS, Jun 2012, Paris, France CNRS - Centre national de la recherche scientifique SysMic Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier MIC Département Microélectronique Mathématiques, Informatique, Physique et Systèmes Université de Montpellier Université de Montpellier (2015-2021) Centrale Lyon - périmètre strict National No No Yes No Dynamic Mode Testing of SRAMS under Neutron Radiation Georgios Tsiligiannis 380a43881ac7fd0e28980fc41132b360 lirmm.fr 938500 527273-938500 https://orcid.org/0000-0002-8976-559X Luigi Dilillo 91b6da8421e1a299e00bf5311da76a1d lirmm.fr luigi-dilillo 172470 17660-172470 https://www.idref.fr/18891885X https://orcid.org/0000-0002-1295-2688 Alberto Bosio d520d64169c259e699ff959bd1bfad6f ec-lyon.fr alberto-bosio 172965 17774-172965 https://orcid.org/0000-0001-6116-7339 https://www.idref.fr/174383592 Patrick Girard 64eced688a71c917544572f77f24aa3d lirmm.fr patrick-girard-lirmm 740458 52018-740458 https://orcid.org/0000-0003-0722-8772 Aida Todri-Sanial 940978124f8251d4bd025a25619d2a65 lirmm.fr todri 6348 28421-6348 http://www.researcherid.com/rid/M-5156-2013 https://orcid.org/0000-0001-8573-2910 https://scholar.google.fr/citations?user=-awivq4AAAAJ&hl=en https://www.idref.fr/235598879 http://www.researcherid.com/rid/http://www.researcherid.com/rid/M-5156-2013 Arnaud Virazel 514b9bdb53dacba2fd794d9140b751ae lirmm.fr arnaud-virazel 18065 17611-18065 https://www.idref.fr/068454724 http://isni.org/isni/0000000139422532 https://orcid.org/0000-0001-7398-7107 Sixième colloque du GDR SOC-SIP du CNRS 2012-06-13 2012-06-15 Paris France 2012 http://www2.lirmm.fr/~w3mic/SOCSIP/index.php/colloque/colloque-2012 English SRAM Single Event Upset Cross-section test radiation neutrons Engineering Sciences [physics]/Electronics Conference papers Conference papers Conference papers

Electronic system reliability over soft errors is very critical as the transistor size shrinks. Many recent works have defined the device error rate under radiation for SRAMs in hold mode (static) and during operation (dynamic). This paper evaluates the impact of running test algorithms on SRAMs exposed to neutron radiation in order to define their stressing factor. The results that we show are based on experiments performed at the TSL facility in Uppsala, Sweden using a Quasi-Monoenergetic neutron beam. The evaluation of the test algorithms is based on the calculated device SEU cross section.

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