Layout-Aware Pattern Evaluation and Analysis for Power-Safe Application of TDF Patterns - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Journal Articles Journal of Low Power Electronics Year : 2012

Layout-Aware Pattern Evaluation and Analysis for Power-Safe Application of TDF Patterns

Patrick Girard
Conception et Test de Systèmes MICroélectroniques
CV
Mohammad Tehranipoor
  • Function : Author
University of Connecticut
Hassan Salmani
  • Function : Author
  • PersonId : 940569
University of Connecticut
Wei Zhao
  • Function : Author
University of Connecticut
Xiaoqing Wen
Kyushu Institute of Technology

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Micro and nanotechnologies/Microelectronics

Patrick Girard  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00816606

Submitted on : Monday, April 22, 2013-3:37:42 PM

Last modification on : Friday, March 24, 2023-2:52:57 PM

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lirmm-00816606 , version 1 (22-04-2013)

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Patrick Girard, Mohammad Tehranipoor, Hassan Salmani, Wei Zhao, Xiaoqing Wen. Layout-Aware Pattern Evaluation and Analysis for Power-Safe Application of TDF Patterns. Journal of Low Power Electronics, 2012, 8 (2), pp.248-258. ⟨10.1166/jolpe.2012.1188⟩. ⟨lirmm-00816606⟩

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