Tutorial intitulé "Power-Aware Testing and Test Strategies for Low Power Devices"
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Conference Papers
Year : 2010
Patrick Girard : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00820692
Submitted on : Monday, May 6, 2013-2:32:30 PM
Last modification on : Tuesday, September 17, 2024-10:16:17 AM
Long-term archiving on : Monday, August 19, 2013-3:25:31 PM
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- HAL Id : lirmm-00820692 , version 1
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Patrick Girard, Nicola Nicolici, Xiaoqing Wen. Tutorial intitulé "Power-Aware Testing and Test Strategies for Low Power Devices". ICM'2010: International Conference on Microelectronics, Dec 2010, La Caire, Egypt. ⟨lirmm-00820692⟩
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