Fault-Effect Propagation Based Intra-cell Scan Chain Diagnosis - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Poster Year : 2013
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lirmm-00839113 , version 1 (27-06-2013)

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  • HAL Id : lirmm-00839113 , version 1

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Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Fault-Effect Propagation Based Intra-cell Scan Chain Diagnosis. Colloque GDR SoC-SiP, Jun 2013, Lyon, France. 2013. ⟨lirmm-00839113⟩
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