Fault-Effect Propagation Based Intra-cell Scan Chain Diagnosis - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Poster Year : 2013

Fault-Effect Propagation Based Intra-cell Scan Chain Diagnosis

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Micro and nanotechnologies/Microelectronics

Arnaud Virazel  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00839113

Submitted on : Thursday, June 27, 2013-11:13:53 AM

Last modification on : Friday, March 24, 2023-2:52:57 PM

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lirmm-00839113 , version 1 (27-06-2013)

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  • HAL Id : lirmm-00839113 , version 1

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Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Fault-Effect Propagation Based Intra-cell Scan Chain Diagnosis. Colloque GDR SoC-SiP, Jun 2013, Lyon, France. 2013. ⟨lirmm-00839113⟩

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