E. H. Neto, Using Bulk Built-in Current Sensors to Detect Soft Errors, IEEE Micro, vol.26, issue.5, pp.10-18, 2006.
DOI : 10.1109/MM.2006.103

E. H. Neto, Tbulk-BICS: A Built-In Current Sensor Robust to Process and Temperature Variations for Soft Error Detection, IEEE Transactions on Nuclear Science, vol.55, issue.4, pp.2281-2288, 2008.
DOI : 10.1109/TNS.2008.920426

F. S. Torres and R. P. Bastos, Robust modular Bulk Built-in Current Sensors for detection of transient faults, 2012 25th Symposium on Integrated Circuits and Systems Design (SBCCI), pp.1-6, 2012.
DOI : 10.1109/SBCCI.2012.6344422

URL : https://hal.archives-ouvertes.fr/lirmm-00715122

R. P. Bastos, Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode, pp.9-10, 2012.
URL : https://hal.archives-ouvertes.fr/lirmm-00715117

Z. Zhang, A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients, Journal of Electronic Testing, vol.26, issue.6, 2013.
DOI : 10.1007/s10836-013-5364-1

A. Simionovski and G. Wirth, Simulation Evaluation of an Implemented Set of Complementary Bulk Built-In Current Sensors With Dynamic Storage Cell, IEEE Transactions on Device and Materials Reliability, vol.14, issue.1, 2013.
DOI : 10.1109/TDMR.2013.2252176