P. N. Variyam and A. Chatterjee, Enhancing test effectiveness for analog circuits using synthesized measurements, Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231), pp.132-137, 1998.
DOI : 10.1109/VTEST.1998.670860

P. N. Variyam, S. Cherubal, and A. Chatterjee, Prediction of analog performance parameters using fast transient testing, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.21, issue.3, pp.349-361, 2002.
DOI : 10.1109/43.986428

S. Ellouz, Combining Internal Probing with Artificial Neural Networks for Optimal RFIC Testing, 2006 IEEE International Test Conference, pp.1-9, 2006.
DOI : 10.1109/TEST.2006.297705

URL : https://hal.archives-ouvertes.fr/hal-00369455

L. Abdallah, Sensors for built-in alternate RF test, 2010 15th IEEE European Test Symposium, pp.49-54, 2010.
DOI : 10.1109/ETSYM.2010.5512783

URL : https://hal.archives-ouvertes.fr/hal-00558886

M. J. Barragan, Improving the Accuracy of RF Alternate Test Using Multi-VDD Conditions: Application to Envelope-Based Test of LNAs, 2011 Asian Test Symposium, pp.359-364, 2011.
DOI : 10.1109/ATS.2011.15

H. Ayari, Smart selection of indirect parameters for DC-based alternate RF IC testing, 2012 IEEE 30th VLSI Test Symposium (VTS), pp.19-24, 2012.
DOI : 10.1109/VTS.2012.6231074

URL : https://hal.archives-ouvertes.fr/lirmm-00803453

H. Stratigopoulos and Y. Makris, Error Moderation in Low-Cost Machine-Learning-Based Analog/RF Testing, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.27, issue.2, pp.339-351, 2008.
DOI : 10.1109/TCAD.2007.907232

URL : https://hal.archives-ouvertes.fr/hal-00348331

H. Stratigopoulos and S. Mir, Adaptive Alternate Analog Test, IEEE Design & Test of Computers, vol.29, issue.4, pp.71-79, 2012.
DOI : 10.1109/MDT.2012.2205480

URL : https://hal.archives-ouvertes.fr/hal-00743573

H. Ayari, On the Use of Redundancy to Reduce Prediction Error in Alternate Analog/RF Test, 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, pp.34-39, 2012.
DOI : 10.1109/IMS3TW.2012.17

URL : https://hal.archives-ouvertes.fr/lirmm-00803556

H. Ayari, Making predictive analog/RF alternate test strategy independent of training set size Percentage of suspect predictions Initial implementation New impl -version A, IEEE Int'l Test Conf. (ITC)