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Journal Articles Information Security Journal: A Global Perspective Year : 2014

Multi-Level Ionizing-Induced Transient Fault Simulator

Abstract

This paper presents a multi-level fault simulator for digital circuits. Single and multiple transient phenomena are examined at low level in order to model accurately single/multiple event transients at logic level. Multi-level simulation is used for precision of electrical modeling and the conciseness of the coarse grain gate-level modeling. This simulator handles natural and maliciously-induced transient faults, allowing evaluating the robustness of dependable circuits as well as countermeasures against ionizing-induced fault attacks on secure circuits.
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lirmm-01075393 , version 1 (17-10-2014)

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Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Multi-Level Ionizing-Induced Transient Fault Simulator. Information Security Journal: A Global Perspective, 2014, 22 (5-6), pp.251-264. ⟨10.1080/19393555.2014.891280⟩. ⟨lirmm-01075393⟩
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