Sensitivity to fault laser injection: a comparison between 28nm bulk and FD-SOI technology - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2015

Sensitivity to fault laser injection: a comparison between 28nm bulk and FD-SOI technology

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Micro and nanotechnologies/Microelectronics

Giorgio Di Natale  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-01234094

Submitted on : Thursday, November 26, 2015-11:14:15 AM

Last modification on : Tuesday, August 27, 2024-12:46:18 PM

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lirmm-01234094 , version 1 (26-11-2015)

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  • HAL Id : lirmm-01234094 , version 1

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Stephan de Castro, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Sensitivity to fault laser injection: a comparison between 28nm bulk and FD-SOI technology. TRUDEVICE Workshop, Sep 2015, Saint-Malo, France. ⟨lirmm-01234094⟩

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