Conference Papers
Year : 2015
Giorgio Di Natale : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01234094
Submitted on : Thursday, November 26, 2015-11:14:15 AM
Last modification on : Tuesday, August 27, 2024-12:46:18 PM
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- HAL Id : lirmm-01234094 , version 1
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Stephan de Castro, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Sensitivity to fault laser injection: a comparison between 28nm bulk and FD-SOI technology. TRUDEVICE Workshop, Sep 2015, Saint-Malo, France. ⟨lirmm-01234094⟩
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