Sensitivity to fault laser injection: a comparison between 28nm bulk and FD-SOI technology

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01234094
Contributor : Giorgio Di Natale <>
Submitted on : Thursday, November 26, 2015 - 11:14:15 AM
Last modification on : Thursday, October 17, 2019 - 12:33:43 PM

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  • HAL Id : lirmm-01234094, version 1

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Stephan de Castro, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Sensitivity to fault laser injection: a comparison between 28nm bulk and FD-SOI technology. TRUDEVICE Workshop, Sep 2015, Saint-Malo, France. ⟨lirmm-01234094⟩

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