Dynamic Test Methods for COTS SRAMs

Abstract : In previous works, we have demonstrated the importance of dynamic mode testing of SRAM components under ionizing radiation. Several types of failures are difficult to expose when the device is tested under static (retention) mode. With the purpose of exploring and defining the most complete testing procedures and reveal the potential hazardous behaviors of SRAM devices, we present novel methods for the dynamic mode radiation testing of SRAMs. The proposed methods are based on different word address accessing schemes and data background: Fast Row, Fast Column, Pseudorandom, Adjacent (Gray) and Inverse Adjacent (Gray). These methods are evaluated by heavy ion and atmospheric-like neutron irradiation of two COTS SRAMs of 90 nm and 65 nm technology.
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Article dans une revue
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (6), pp.3095-3102. 〈http://ieeexplore.ieee.org/Xplore/home.jsp〉. 〈10.1109/TNS.2014.2363123〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01234463
Contributeur : Luigi Dilillo <>
Soumis le : jeudi 26 novembre 2015 - 23:36:51
Dernière modification le : jeudi 11 janvier 2018 - 06:27:29

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Georgios Tsiligiannis, Luigi Dilillo, Viyas Gupta, Alberto Bosio, Patrick Girard, et al.. Dynamic Test Methods for COTS SRAMs. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (6), pp.3095-3102. 〈http://ieeexplore.ieee.org/Xplore/home.jsp〉. 〈10.1109/TNS.2014.2363123〉. 〈lirmm-01234463〉

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