Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion Irradiation - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2014

Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion Irradiation

Aida Todri-Sanial
Helmut Puchner
Arto Javanainen
  • Function : Author
Ari Virtanen
  • Function : Author

Abstract

We present novel methods for the dynamic mode radiation testing of SRAMs, based on different address accessing schemes: Fast Row, Fast Column and Pseudorandom. These methods are evaluated by heavy ion irradiation of two SRAMs.

Keywords

No file

Dates and versions

lirmm-01237660 , version 1 (03-12-2015)

Identifiers

  • HAL Id : lirmm-01237660 , version 1

Cite

Georgios Tsiligiannis, Luigi Dilillo, Viyas Gupta, Alberto Bosio, Patrick Girard, et al.. Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion Irradiation. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France. ⟨lirmm-01237660⟩
164 View
0 Download

Share

Gmail Mastodon Facebook X LinkedIn More