Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion Irradiation

Georgios Tsiligiannis 1 Luigi Dilillo 1 Viyas Gupta 1 Alberto Bosio 1 Patrick Girard 1 Aida Todri-Sanial 2 Arnaud Virazel 1 Helmut Puchner Alexandre Louis Bosser 1 Arto Javanainen Ari Virtanen Frédéric Wrobel 3, 4 Laurent Dusseau 5, 3, 4 Frédéric Saigné 3, 4
1 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 SmartIES - Smart Integrated Electronic Systems
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
4 RADIAC - Radiations et composants
IES - Institut d’Electronique et des Systèmes
Abstract : We present novel methods for the dynamic mode radiation testing of SRAMs, based on different address accessing schemes: Fast Row, Fast Column and Pseudorandom. These methods are evaluated by heavy ion irradiation of two SRAMs.
Keywords : SRAM SEU COTS Heavy ions
Document type :
Conference papers
Complete list of metadatas

https://hal-lirmm.ccsd.cnrs.fr/lirmm-01237660
Contributor : Luigi Dilillo <>
Submitted on : Thursday, December 3, 2015 - 3:46:26 PM
Last modification on : Tuesday, May 28, 2019 - 5:10:10 PM

Identifiers

  • HAL Id : lirmm-01237660, version 1

Collections

Citation

Georgios Tsiligiannis, Luigi Dilillo, Viyas Gupta, Alberto Bosio, Patrick Girard, et al.. Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion Irradiation. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France. ⟨lirmm-01237660⟩

Share

Metrics

Record views

188