D. Samyde, S. Skorobogatov, R. Anderson, and J. Quisquater, On a new way to read data from memory, Security in Storage Workshop, pp.65-69, 2002.

J. Schmidt and M. Hutter, Optical and em fault-attacks on crt-based rsa: Concrete results. na, 2007.

A. Dehbaoui, J. M. Dutertre, B. Robisson, P. Orsatelli, P. Maurine et al., Injection of transient faults using electromagnetic pulses -Practical results on a cryptographic system, Cryptology ePrint Archive, 2012.

P. Maurine, Techniques for em fault injection: equipments and experimental results, Fault Diagnosis and Tolerance in Cryptography (FDTC), 2012 Workshop on, pp.3-4, 2012.
URL : https://hal.archives-ouvertes.fr/lirmm-00761778

A. G. Yanci, S. Pickles, and T. Arslan, Detecting voltage glitch attacks on secure devices, Bio-inspired Learning and Intelligent Systems for Security, 2008. BLISS'08. ECSIS Symposium on, pp.75-80, 2008.

J. J. Franco, E. Boemo, E. Castillo, and L. Parrilla, Ring oscillators as thermal sensors in fpgas: Experiments in low voltage, Programmable Logic Conference (SPL), 2010 VI Southern, pp.133-137, 2010.

J. Unsworth and M. Mapson, Electro-active cradle circuits for the detection of access or penetration, vol.353, p.350, 41994-10.

L. Zussa, A. Dehbaoui, K. Tobich, J. Dutertre, P. Maurine et al., Efficiency of a glitch detector against electromagnetic fault injection, Proceedings of the conference on Design, Automation & Test in Europe. European Design and Automation Association, p.203, 2014.
URL : https://hal.archives-ouvertes.fr/lirmm-01096047

S. Yang, W. Wolf, N. Vijaykrishnan, D. N. Serpanos, and Y. Xie, Power attack resistant cryptosystem design: a dynamic voltage and frequency switching approach, Proceedings of the conference on Design, Automation and Test in Europe, vol.3, pp.64-69, 2005.
URL : https://hal.archives-ouvertes.fr/hal-00181822

S. Ordas, L. Guillaume-sage, K. Tobich, J. Dutertre, and P. Maurine, Evidence of a larger EM-induced fault model, Smart Card Research and Advanced Application Conference (CARDIS), 2014.
URL : https://hal.archives-ouvertes.fr/emse-01099037

F. Poucheret, K. Tobich, M. Lisart, L. Chusseau, B. Robisson et al., Local and direct em injection of power into cmos integrated circuits, Fault Diagnosis and Tolerance in Cryptography (FDTC), pp.100-104, 2011.

P. Bayon, L. Bossuet, and A. Aubert, Random number generation: a potential target of electromagnetic emanation analysis, Cryptographic Architectures Embedded in Reconfigurable Devices, 2011.
URL : https://hal.archives-ouvertes.fr/ujm-00667824

A. Dehbaoui, J. Dutertre, B. Robisson, and A. Tria, Electromagnetic transient faults injection on a hardware and a software implementations of AES, Fault Diagnosis and Tolerance in Cryptography (FDTC), 2012 Workshop on, pp.7-15, 2012.
URL : https://hal.archives-ouvertes.fr/emse-00742639

, FIPS, vol.197, pp.2015-2018

S. Ordas, L. Guillaume-sage, and P. Maurine, Em injection: Fault model and locality, Fault Diagnosis and Tolerance in Cryptography (FDTC 2015), 2015.
URL : https://hal.archives-ouvertes.fr/lirmm-01319078

K. Tobich, P. Maurine, P. Liardet, M. Lisart, and T. Ordas, Voltage spikes on the substrate to obtain timing faults, Euromicro Conference on. IEEE, pp.483-486, 2013.
URL : https://hal.archives-ouvertes.fr/lirmm-01096076