On the Generation of Diagnostic Test Set for Intra-cell Defects - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2014

On the Generation of Diagnostic Test Set for Intra-cell Defects

Abstract

In this paper, we investigate the generation of diagnostic test vectors targeting the intra-cell defects. Experimental results carried out on an industrial circuit show that we actually increase the diagnosis resolution by adding few more diagnostic test patterns.
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lirmm-01272539 , version 1 (15-03-2016)

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Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, et al.. On the Generation of Diagnostic Test Set for Intra-cell Defects. ATS: Asian Test Symposium, Nov 2014, Hangzhou, China. pp.312-317, ⟨10.1109/ATS.2014.57⟩. ⟨lirmm-01272539⟩
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