On the Generation of Diagnostic Test Set for Intra-cell Defects
Abstract
In this paper, we investigate the generation of diagnostic test vectors targeting the intra-cell defects. Experimental results carried out on an industrial circuit show that we actually increase the diagnosis resolution by adding few more diagnostic test patterns.
Keywords
Fault diagnosis
Integrated circuit testing
Diagnosis resolution
Diagnostic test patterns
diagnostic test set
Diagnostic test vectors
Circuit faults
Vectors
Automatic test pattern generation
Dictionaries
Computer architecture
Industrial circuit
Intra-cell defects
Logic gates
Integrated circuit modeling
ATPG
Diagnosis
Test