On the Generation of Diagnostic Test Set for Intra-cell Defects - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Communication Dans Un Congrès Année : 2014

On the Generation of Diagnostic Test Set for Intra-cell Defects

Résumé

In this paper, we investigate the generation of diagnostic test vectors targeting the intra-cell defects. Experimental results carried out on an industrial circuit show that we actually increase the diagnosis resolution by adding few more diagnostic test patterns.
Fichier non déposé

Dates et versions

lirmm-01272539 , version 1 (15-03-2016)

Identifiants

Citer

Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, et al.. On the Generation of Diagnostic Test Set for Intra-cell Defects. ATS: Asian Test Symposium, Nov 2014, Hangzhou, China. pp.312-317, ⟨10.1109/ATS.2014.57⟩. ⟨lirmm-01272539⟩
152 Consultations
0 Téléchargements

Altmetric

Partager

More