Design-for-Diagnosis Architecture for Power Switches
Résumé
Power-gating techniques have been adopted so far to reduce the static power consumption of an Integrated Circuit (IC). Power-gating is usually implemented by means of several power switches. Manufacturing defects affecting power switches can lead to increase the actual static power consumption and, in the worst case, they can completely isolate a functional block in the IC. Thus, efficient test and diagnosis solutions are needed. In this paper we propose a Design-for-Diagnosis architecture for Power Switches. The proposed approach has been validated through SPICE simulations on ITC'99 benchmark circuits as well as on industrial test case.
Mots clés
Circuit faults
Integrated circuits
Monitoring
Power demand
Silicon
Switches
Integrated circuit design
Power integrated circuits
Static power consumption
Power-gating techniques
power switches
integrated circuit
Design for Diagnosis
Design for Test
Transistors
design-for-diagnosis architecture
design for testability
Power Management
Power Switch