Conference Papers
Year : 2016
Florence Azais : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01374300
Submitted on : Friday, September 30, 2016-11:18:06 AM
Last modification on : Friday, March 24, 2023-2:53:02 PM
Cite
Amit Karel, Mariane Comte, Jean-Marc J.-M. Galliere, Florence Azaïs, Michel Renovell. Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect. LATS: Latin-American Test Symposium, Mar 2016, Foz do Iguacu, Brazil. pp.129-134, ⟨10.1109/LATW.2016.7483352⟩. ⟨lirmm-01374300⟩
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