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Aging and voltage scaling impacts under neutron-induced soft error rate in SRAM-based FPGAs Fernanda Lima Kastensmidt 981412-0 Jorge Tonfat 904559-0 Thiago Both 904695-0 Paolo Rech 59fd8fedf1b45fdc9a475f2f682658ab lirmm.fr 938758 509741-938758 Gilson Wirth 904561-0 Ricardo Reis 26589f392d5452e606e8cc6c227d7528 inf.ufrgs.br 844036 1067937-844036 Florent Bruguier fe83bf965c0d4846e2dd90b134b170d0 lirmm.fr florent-bruguier 443 21663-443 https://orcid.org/0000-0002-7897-5700 https://www.idref.fr/166292044 Pascal Benoit 59dca0e1be5bf8c5b6fac9dd8ef4ff35 lirmm.fr pascal-benoit 3919 25210-3919 https://www.idref.fr/069480915 https://orcid.org/0000-0002-2945-5725 Lionel Torres de43bd940234e701cde869cc921c42cc lirmm.fr 929667 656983-929667 https://orcid.org/0000-0001-5807-5070 Christopher Frost 45ed96387a3f5c64c743b9d52c8463bf stfc.ac.uk 938538 699723-938538 Caroline Lebrun 0de77cee81533135d8219fa336bb3bc7 lirmm.fr 2016-12-21 16:10:09 2025-11-06 15:24:03 2016-12-21 18:12:38 2014-05-26 2016-12-21 contributor Caroline Lebrun 0de77cee81533135d8219fa336bb3bc7 lirmm.fr CCSD lirmm-01421128 https://hal-lirmm.ccsd.cnrs.fr/lirmm-01421128 limakastensmidt:lirmm-01421128 <i>ETS: European Test Symposium</i>, May 2014, Paderborn, Germany. <a target="_blank" href="https://dx.doi.org/10.1109/ETS.2014.6847845">⟨10.1109/ETS.2014.6847845⟩</a> ETS: European Test Symposium, May 2014, Paderborn, Germany. ⟨10.1109/ETS.2014.6847845⟩ HAL Authorization CNRS - Centre national de la recherche scientifique SysMic Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier MIC Département Microélectronique Mathématiques, Informatique, Physique et Systèmes Université de Montpellier Université de Montpellier (2015-2021) International No No Yes Yes Aging and voltage scaling impacts under neutron-induced soft error rate in SRAM-based FPGAs Fernanda Lima Kastensmidt 981412-0 Jorge Tonfat 904559-0 Thiago Both 904695-0 Paolo Rech 59fd8fedf1b45fdc9a475f2f682658ab lirmm.fr 938758 509741-938758 Gilson Wirth 904561-0 Ricardo Reis 26589f392d5452e606e8cc6c227d7528 inf.ufrgs.br 844036 1067937-844036 Florent Bruguier fe83bf965c0d4846e2dd90b134b170d0 lirmm.fr florent-bruguier 443 21663-443 https://orcid.org/0000-0002-7897-5700 https://www.idref.fr/166292044 Pascal Benoit 59dca0e1be5bf8c5b6fac9dd8ef4ff35 lirmm.fr pascal-benoit 3919 25210-3919 https://www.idref.fr/069480915 https://orcid.org/0000-0002-2945-5725 Lionel Torres de43bd940234e701cde869cc921c42cc lirmm.fr 929667 656983-929667 https://orcid.org/0000-0001-5807-5070 Christopher Frost 45ed96387a3f5c64c743b9d52c8463bf stfc.ac.uk 938538 699723-938538 19th IEEE European Test Symposium ETS: European Test Symposium 2014-05-26 2014-05-30 Paderborn Germany 2014 10.1109/ETS.2014.6847845 English volage scalling aging radiation FPGA Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics Conference papers Conference papers Conference papers

This work investigates the effects of aging and voltage scaling in neutron-induced bit-flip in SRAM-based FPGAs. Experimental results show that aging and voltage scaling can increase in at least two times the susceptibility of SRAM-based FPGAs to Soft Error Rate (SER). These results are innovative, because they combine three real effects that occur in programmable circuits operating at ground-level applications. In addition, a model at electrical simulation for aging, soft error and different voltages was described to investigate the effects observed at the practical neutron irradiation experiment. Results can guide designers to predict soft error effects during the lifetime of devices operating in different power supply mode.

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