Test of Low Power Circuits: Issues and Industrial Practices - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2016

Test of Low Power Circuits: Issues and Industrial Practices

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Micro and nanotechnologies/Microelectronics

Arnaud Virazel  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-01433330

Submitted on : Thursday, January 12, 2017-3:52:18 PM

Last modification on : Friday, March 24, 2023-2:53:03 PM

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lirmm-01433330 , version 1 (12-01-2017)

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  • HAL Id : lirmm-01433330 , version 1

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Alberto Bosio, Patrick Girard, Arnaud Virazel. Test of Low Power Circuits: Issues and Industrial Practices. ICECS: International Conference on Electronics, Circuits and Systems, Dec 2016, Monte Carlo, Monaco. ⟨lirmm-01433330⟩

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