Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI)

Abstract : Electromagnetic fault injections are produced on secured ICs aiming to break crypto codes. We describe in this paper the whole chain of optimization necessary to achieve this goal, namely 1/ physical optimization of near-field probe and setup, 2/ signal management in timing, shape, and localization to induce the fault while beating countermeasures and 3/ understanding of fault propagation in logic to eventually protect future ICs.
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01434592
Contributor : Caroline Lebrun <>
Submitted on : Friday, January 13, 2017 - 12:19:31 PM
Last modification on : Friday, June 14, 2019 - 6:31:14 PM

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Laurent Chusseau, Rachid Omarouayache, Jérémy Raoult, Sylvie Jarrix, Philippe Maurine, et al.. Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI). VLSI-SoC: Very Large Scale Integration - System-on-Chip, Oct 2014, Playa del Carmen, Mexico. pp.1-6, ⟨10.1109/VLSI-SoC.2014.7004189⟩. ⟨lirmm-01434592⟩

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