Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI)

Abstract : Electromagnetic fault injections are produced on secured ICs aiming to break crypto codes. We describe in this paper the whole chain of optimization necessary to achieve this goal, namely 1/ physical optimization of near-field probe and setup, 2/ signal management in timing, shape, and localization to induce the fault while beating countermeasures and 3/ understanding of fault propagation in logic to eventually protect future ICs.
Type de document :
Communication dans un congrès
VLSI-SoC: Very Large Scale Integration - System-on-Chip, Oct 2014, Playa del Carmen, Mexico. 22nd International Conference on Very Large Scale Integration, pp.1-6, 2014, 〈10.1109/VLSI-SoC.2014.7004189〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01434592
Contributeur : Caroline Lebrun <>
Soumis le : vendredi 13 janvier 2017 - 12:19:31
Dernière modification le : vendredi 15 juin 2018 - 01:19:07

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Laurent Chusseau, Rachid Omarouayache, Jérémy Raoult, Sylvie Jarrix, Philippe Maurine, et al.. Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI). VLSI-SoC: Very Large Scale Integration - System-on-Chip, Oct 2014, Playa del Carmen, Mexico. 22nd International Conference on Very Large Scale Integration, pp.1-6, 2014, 〈10.1109/VLSI-SoC.2014.7004189〉. 〈lirmm-01434592〉

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