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Poster communications

Small Delay Defect Investigation in Critical Path Delay with Multiple TSVs

Carolina Momo Metzler 1 Aida Todri-Sanial 2 Patrick Girard 3
2 SmartIES - Smart Integrated Electronic Systems
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
3 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Document type :
Poster communications
Complete list of metadatas

https://hal-lirmm.ccsd.cnrs.fr/lirmm-01456983
Contributor : Caroline Lebrun <>
Submitted on : Monday, February 6, 2017 - 10:41:35 AM
Last modification on : Wednesday, December 11, 2019 - 1:32:02 AM

Identifiers

  • HAL Id : lirmm-01456983, version 1

Citation

Carolina Momo Metzler, Aida Todri-Sanial, Patrick Girard. Small Delay Defect Investigation in Critical Path Delay with Multiple TSVs. EMicro-NE, Oct 2015, Campina Grande, Brazil. X Escola de Microeletrônica do Nordeste, 2015. ⟨lirmm-01456983⟩

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