Small Delay Defect Investigation in Critical Path Delay with Multiple TSVs

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Poster communications
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01456983
Contributor : Caroline Lebrun <>
Submitted on : Monday, February 6, 2017 - 10:41:35 AM
Last modification on : Wednesday, April 17, 2019 - 6:18:02 PM

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  • HAL Id : lirmm-01456983, version 1

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Carolina Momo Metzeler, Aida Todri-Sanial, Patrick Girard. Small Delay Defect Investigation in Critical Path Delay with Multiple TSVs. EMicro-NE, Oct 2015, Campina Grande, Brazil. X Escola de Microeletrônica do Nordeste, 2015, ⟨https://sites.google.com/site/emicrone2015/⟩. ⟨lirmm-01456983⟩

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