Small Delay Defect Investigation in Critical Path Delay with Multiple TSVs - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Poster Year : 2015
No file

Dates and versions

lirmm-01456983 , version 1 (06-02-2017)

Identifiers

  • HAL Id : lirmm-01456983 , version 1

Cite

Carolina Momo Metzler, Aida Todri-Sanial, Patrick Girard. Small Delay Defect Investigation in Critical Path Delay with Multiple TSVs. EMicro-NE, Oct 2015, Campina Grande, Brazil. , X Escola de Microeletrônica do Nordeste, 2015. ⟨lirmm-01456983⟩
125 View
0 Download

Share

Gmail Facebook X LinkedIn More