Small Delay Defect Investigation in Critical Path Delay with Multiple TSVs - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Poster Year : 2015

Small Delay Defect Investigation in Critical Path Delay with Multiple TSVs

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01456983

Submitted on : Monday, February 6, 2017-10:41:35 AM

Last modification on : Friday, March 24, 2023-2:53:03 PM

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lirmm-01456983 , version 1 (06-02-2017)

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  • HAL Id : lirmm-01456983 , version 1

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Carolina Momo Metzler, Aida Todri-Sanial, Patrick Girard. Small Delay Defect Investigation in Critical Path Delay with Multiple TSVs. EMicro-NE, Oct 2015, Campina Grande, Brazil. , X Escola de Microeletrônica do Nordeste, 2015. ⟨lirmm-01456983⟩

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