Analytical Study of On-chip Generations of Analog Sine-wave Based on Combined Digital Signals

Stéphane David-Grignot 1 Achraf Lamlih 1 Vincent Kerzérho 1 Florence Azaïs 2 Fabien Soulier 1 Serge Bernard 1
1 SmartIES - Smart Integrated Electronic Systems
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : On-chip sine-wave signal generation is widely covered by literature for Built-In-Self Test (BIST) or biosensor applications. The objective is to generate pure and robust sine-wave signal with minimal hardware resources. An attractive solution consists in combining several digital signals to built this analog sine-wave. The objective of this paper is to give an analytical study of various potential solutions based on digital-based approaches. Thanks to this study, we prove that technique consisting in setting the phase shifts and various amplitude values of the square-wave signals is the most efficient approach. Moreover, this study allows the selection of the best solution in terms of parameters of the square-wave signals to cancel low-order harmonics of the generated signal.
Type de document :
Communication dans un congrès
IMSTW: International Mixed Signals Testing Workshop, Jul 2017, Thessaloniki, Greece. IEEE, 22nd IEEE International Mixed Signals Testing Workshop, 2017, 〈http://tima.univ-grenoble-alpes.fr/conferences/imstw/imstw17/〉. 〈10.1109/IMS3TW.2017.7995205〉
Liste complète des métadonnées

https://hal-lirmm.ccsd.cnrs.fr/lirmm-01699387
Contributeur : Stéphane David-Grignot <>
Soumis le : mercredi 14 février 2018 - 09:13:25
Dernière modification le : mardi 23 octobre 2018 - 17:16:01
Document(s) archivé(s) le : lundi 7 mai 2018 - 22:20:40

Fichier

IMSTW17 no copyright.pdf
Fichiers produits par l'(les) auteur(s)

Identifiants

Citation

Stéphane David-Grignot, Achraf Lamlih, Vincent Kerzérho, Florence Azaïs, Fabien Soulier, et al.. Analytical Study of On-chip Generations of Analog Sine-wave Based on Combined Digital Signals. IMSTW: International Mixed Signals Testing Workshop, Jul 2017, Thessaloniki, Greece. IEEE, 22nd IEEE International Mixed Signals Testing Workshop, 2017, 〈http://tima.univ-grenoble-alpes.fr/conferences/imstw/imstw17/〉. 〈10.1109/IMS3TW.2017.7995205〉. 〈lirmm-01699387〉

Partager

Métriques

Consultations de la notice

394

Téléchargements de fichiers

59