A Case Study on the Approximate Test of Integrated Circuits - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2016

A Case Study on the Approximate Test of Integrated Circuits

Domains

Micro and nanotechnologies/Microelectronics

Arnaud Virazel  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-01718609

Submitted on : Tuesday, February 27, 2018-3:16:35 PM

Last modification on : Friday, March 24, 2023-2:53:06 PM

No file

Dates and versions

lirmm-01718609 , version 1 (27-02-2018)

Identifiers

  • HAL Id : lirmm-01718609 , version 1

Cite

Imran Wali, Arnaud Virazel, Patrick Girard, Mario Barbareschi, Alberto Bosio. A Case Study on the Approximate Test of Integrated Circuits. AC: Approximate Computing, Oct 2016, Pittsburgh, PA, United States. ⟨lirmm-01718609⟩

Export

BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite

Collections

UNIV-RENNES1 CNRS INRIA INSA-RENNES IRISA LIRMM CENTRALESUPELEC INRIA2 UR1-MATH-STIC UR1-UFR-ISTIC TEST LIRMM_MIC MIC MIPS UNIV-MONTPELLIER UNIV-RENNES UR1-MATH-NUM EC_LYON_STRICT
152 View
0 Download

Share

More