Conference Papers Year : 2016

A Case Study on the Approximate Test of Integrated Circuits

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Micro and nanotechnologies/Microelectronics

Arnaud Virazel  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-01718609

Submitted on : Tuesday, February 27, 2018-3:16:35 PM

Last modification on : Wednesday, November 6, 2024-11:10:02 AM

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lirmm-01718609 , version 1 (27-02-2018)

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  • HAL Id : lirmm-01718609 , version 1

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Imran Wali, Arnaud Virazel, Patrick Girard, Mario Barbareschi, Alberto Bosio. A Case Study on the Approximate Test of Integrated Circuits. AC: Approximate Computing, Oct 2016, Pittsburgh, PA, United States. ⟨lirmm-01718609⟩

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UNIV-RENNES1 CNRS INRIA INSA-RENNES IRISA LIRMM CENTRALESUPELEC INRIA2 UR1-MATH-STIC UR1-UFR-ISTIC TEST LIRMM_MIC MIC MIPS UNIV-MONTPELLIER UNIV-RENNES UR1-MATH-NUM EC_LYON_STRICT
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