Scan Chain Encryption for the Test, Diagnosis and Debug of Secure Circuits - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Poster Year : 2017

Scan Chain Encryption for the Test, Diagnosis and Debug of Secure Circuits

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Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics
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Mathieu Da Silva  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-01892667

Submitted on : Wednesday, October 10, 2018-5:46:28 PM

Last modification on : Friday, March 24, 2023-2:53:08 PM

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lirmm-01892667 , version 1 (10-10-2018)

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  • HAL Id : lirmm-01892667 , version 1

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Mathieu da Silva, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Scan Chain Encryption for the Test, Diagnosis and Debug of Secure Circuits. SETS: South European Test Seminar, Mar 2017, Alpe d'Huez, France. , 2017. ⟨lirmm-01892667⟩

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CNRS LIRMM TEST LIRMM_MIC MIC MIPS UNIV-MONTPELLIER
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