B. Yang, K. Wu, and R. Karri, Scan Based Side Channel Attack on Dedicated Hardware Implementations of Data Encryption Standard, Proceedings ITC International Test Conference, pp.339-344, 2004.

B. Yang, K. Wu, and R. Karri, Secure Scan: A Design-for-Test Architecture for Crypto Chips, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.25, pp.2287-2293, 2006.

J. Da-rolt, G. D. Natale, M. Flottes, and B. Rouzeyre, New Security Threats Against Chips Containing Scan Chain Structures, IEEE International Symposium on Hardware-Oriented Security and Trust (HOST), 2011.
URL : https://hal.archives-ouvertes.fr/lirmm-00599690

S. S. Ali, O. Sinanoglu, S. M. Saeed, and R. Karri, New scan-based attack using only the test mode, IFIP/IEEE 21st International Conference on Very Large Scale Integration (VLSI-SoC), pp.234-239, 2013.
URL : https://hal.archives-ouvertes.fr/hal-01380298

J. Da-rolt, B. Rouzeyre, M. Flottes, G. D. Natale, A. Das et al., A scan-based attack on Elliptic Curve Cryptosystems in presence of industrial Design-for-Testability structures, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), pp.43-48, 2012.
URL : https://hal.archives-ouvertes.fr/lirmm-00744472

Y. Liu, K. Wu, and R. Karri, Scan-based Attacks on Linear Feedback Shift Register Based Stream Ciphers, ACM Transactions on Design Automation of Electronic Systems (TODAES), vol.16, 2011.