Circuit arrangement, a method for testing a supply voltage provided to a test circuit, and a method for repairing a voltage source - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Patents Year : 2013

Circuit arrangement, a method for testing a supply voltage provided to a test circuit, and a method for repairing a voltage source

Domains

Micro and nanotechnologies/Microelectronics

Arnaud Virazel  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-02089895

Submitted on : Thursday, April 4, 2019-11:43:09 AM

Last modification on : Friday, March 24, 2023-2:53:10 PM

No file

Dates and versions

lirmm-02089895 , version 1 (04-04-2019)

Identifiers

  • HAL Id : lirmm-02089895 , version 1

Cite

Leonardo B. Zordan, Patrick Girard, Alberto Bosio, Nabil Badereddine. Circuit arrangement, a method for testing a supply voltage provided to a test circuit, and a method for repairing a voltage source. France, Patent n° : US20140307515. 2013. ⟨lirmm-02089895⟩

Export

BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite

Collections

CNRS LIRMM TEST LIRMM_MIC MIC MIPS UNIV-MONTPELLIER EC_LYON_STRICT
51 View
0 Download

Share

More