Software controlled cell bit-density to improve NAND flash lifetime - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2012

Software controlled cell bit-density to improve NAND flash lifetime

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lirmm-02094087 , version 1 (09-04-2019)

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Xavier Jimenez, David Novo, Paolo Ienne. Software controlled cell bit-density to improve NAND flash lifetime. DAC: Design Automation Conference, Jun 2012, San Francisco, United States. pp.229-234, ⟨10.1145/2228360.2228404⟩. ⟨lirmm-02094087⟩

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