F. Demmerle, Integrated RF-CMOS Transceivers challenge RF Test, Proc. IEEE Int'l Test Conf, 2006.

I. Kore, Multi-site test of RF transceivers on low-cost digital ATE, Proc. IEEE International Test Conference (ITC), pp.1-10, 2011.

C. H. Peng, A novel RF self test for a combo SoC on digital ATE with multi-site applications, Proc. Int'l Test Conf. (ITC), p.8, 2014.

M. Ishida and K. Ichiyama, An ATE System for Testing RF Digital Communication Devices With QAM Signal Interfaces, IEEE Design & Test, vol.33, issue.6, pp.15-22, 2016.

T. Vayssade, Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATE, Proc. IEEE Int'l On-Line Test Conferance (IOLTS), p.6, 2018.
URL : https://hal.archives-ouvertes.fr/lirmm-01997910

N. Pous, A Level-Crossing Approach for the Analysis of RF Modulated Signals using only Digital Test Resources, J. of Electronic Testing: Theory and App. (JETTA), vol.27, pp.289-303, 2011.
URL : https://hal.archives-ouvertes.fr/lirmm-00702746

S. David-grignot, Low-cost phase noise testing of complex RF ICs using standard digital ATE, Proc. IEEE Int'l Test Conf. (ITC), p.9, 2014.
URL : https://hal.archives-ouvertes.fr/lirmm-01119356

S. David-grignot, A new technique for low-cost phase noise production testing from 1-bit signal acquisition, Proc.IEEE European Test Symposium (ETS), p.6, 2015.
URL : https://hal.archives-ouvertes.fr/lirmm-01233093

J. Huang and K. Cheng, An on-chip short-time interval measurement technique for testing high-speed communication links, Proc. IEEE VLSI Test Symposium (VTS), pp.380-385, 2001.

S. Sunter and A. Roy, On-chip digital jitter measurement, from megahertz to gigahertz, IEEE Design & Test of Computers, vol.21, issue.4, pp.314-321, 2004.