P. N. Variyam, Prediction of analog performance parameters using fast transient testing, IEEE Trans. On Computer-Aided Design of Integrated Circuits and Systems, vol.21, issue.3, pp.349-361, 2002.

S. Ellouz, Combining internal probing with artficial neural networks for optimal RFIC testing, Proc. IEEE Int'l Test Conference (ITC), p.9, 2006.

H. Ayari, Making predictive analog/RF alternate test strategy independent of training set size, Proc. IEEE Int'l Test Conference (ITC), p.9, 2012.
URL : https://hal.archives-ouvertes.fr/lirmm-00803564

L. Abdallah, Sensors for built-in alternate RF test, Proc. IEEE European Test Symposium (ETS), pp.49-54, 2010.
URL : https://hal.archives-ouvertes.fr/hal-00558886

M. J. Barragan, Improving the Accuracy of RF Alternate Test Using Multi-VDD Conditions: Application to Envelope-Based Test of LNAs, Proc. IEEE Asian Test Symposium (ATS), pp.359-364, 2011.

M. J. Barragan and G. Leger, Efficient selection of signatures for analog/RF alternate test, Proc. European Test Symp. (ETS), p.6, 2013.

A. Gómez-pau, L. Balado, and J. Figueras, Quality metrics for mixedsignal indirect testing, Proc. IEEE Design of Circuits and Integrated Systems (DCIS), 2014.

M. J. Barragan and G. Leger, A Procedure for Alternate Test Feature Design and Selection, IEEE Design & Test, vol.32, pp.18-25, 2015.
URL : https://hal.archives-ouvertes.fr/hal-01142581

S. Larguech, Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies, Microelectronics Journal, vol.46, issue.11, pp.1091-1102, 2015.
URL : https://hal.archives-ouvertes.fr/lirmm-01232890

H. Stratigopoulos, Machine learning applications in IC testing, Proc. IEEE European Test Symposium (ETS), p.10, 2018.
URL : https://hal.archives-ouvertes.fr/hal-02369135

I. Guyon and A. Elisseeff, An introduction to variable and feature selection, Journal of Machine Learning Research, vol.3, pp.1157-1182, 2003.

Z. Zhou, Ensemble Methods: Foundations and Algorithms, Machine Learning & Pattern Recognition Series, 2012.

H. E. Badawi, Use of ensemble methods for indirect test of RF circuits: can it bring benefits?, IEEE Latin Test Symp. (LATS), 2019.
URL : https://hal.archives-ouvertes.fr/lirmm-02338047

S. Larguech, A Framework for Efficient Implementation of Analog/RF Alternate Test with Model Redundancy, Proc. IEEE Computer Society Annual Symp. on VLSI, pp.621-626, 2015.
URL : https://hal.archives-ouvertes.fr/lirmm-01233104