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Making predictive analog/RF alternate test strategy independent of training set size, Proc. IEEE Int'l Test Conference (ITC), p.9, 2012. ,
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Sensors for built-in alternate RF test, Proc. IEEE European Test Symposium (ETS), pp.49-54, 2010. ,
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Improving the Accuracy of RF Alternate Test Using Multi-VDD Conditions: Application to Envelope-Based Test of LNAs, Proc. IEEE Asian Test Symposium (ATS), pp.359-364, 2011. ,
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Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies, Microelectronics Journal, vol.46, issue.11, pp.1091-1102, 2015. ,
URL : https://hal.archives-ouvertes.fr/lirmm-01232890
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A Framework for Efficient Implementation of Analog/RF Alternate Test with Model Redundancy, Proc. IEEE Computer Society Annual Symp. on VLSI, pp.621-626, 2015. ,
URL : https://hal.archives-ouvertes.fr/lirmm-01233104