Prediction of analog performance parameters using fast transient testing, IEEE Trans. On Computer-Aided Design of Integrated Circuits and Systems, vol.21, issue.3, pp.349-361, 2002. ,
Combining internal probing with artficial neural networks for optimal RFIC testing, Proc. IEEE Int'l Test Conference (ITC), p.9, 2006. ,
Sensors for built-in alternate RF test, Proc. IEEE European Test Symposium (ETS), pp.49-54, 2010. ,
URL : https://hal.archives-ouvertes.fr/hal-00558886
Improving the Accuracy of RF Alternate Test Using Multi-VDD Conditions: Application to Envelope-Based Test of LNAs, Proc. IEEE Asian Test Symposium (ATS), pp.359-364, 2011. ,
Ensemble Methods: Foundations and Algorithms, Machine Learning & Pattern Recognition Series, 2012. ,
Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing, Proc. Latin American Test Workshop, vol.6, 2014. ,
URL : https://hal.archives-ouvertes.fr/lirmm-01119361