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Guest Editorial: IEEE Transactions on Emerging Topics in Computing Special Issue on Design & Technology of Integrated Systems in Deep Submicron Era

Giorgio Di Natale 1 Marco Ottavi 2
1 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : The ten papers in this special section address issues related to the design, reliability, security and testing of integrated systems in the nanoscale era. These papers cover a wide spectrum of techniques, including the issues of low-power design, the test, the reliability, the security and trust of circuits manufactured with emerging technologies.
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-02520118
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Submitted on : Thursday, March 26, 2020 - 2:36:57 PM
Last modification on : Tuesday, September 1, 2020 - 11:32:04 AM

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Giorgio Di Natale, Marco Ottavi. Guest Editorial: IEEE Transactions on Emerging Topics in Computing Special Issue on Design & Technology of Integrated Systems in Deep Submicron Era. IEEE Transactions on Emerging Topics in Computing, Institute of Electrical and Electronics Engineers, 2018, 6 (2), pp.170-171. ⟨10.1109/TETC.2018.2802788⟩. ⟨lirmm-02520118⟩

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