SEU Mechanisms in Spintronic Devices: Critical Parameters and Basic Effects - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2020

SEU Mechanisms in Spintronic Devices: Critical Parameters and Basic Effects

Abstract

The paper investigates radiation-induced switching mechanisms, temperature effects, breakdown voltage, sensitive volume and critical charge definitions for Spin-Transfer Torque Magnetic Tunnel Junction.

Domains

Micro and nanotechnologies/Microelectronics

Lionel Torres  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-02957096

Submitted on : Sunday, October 4, 2020-5:52:57 PM

Last modification on : Tuesday, September 3, 2024-11:14:08 AM

No file

Dates and versions

lirmm-02957096 , version 1 (04-10-2020)

Identifiers

  • HAL Id : lirmm-02957096 , version 1

Cite

Odilia Coi, Nomena Andrianjohany, Gregory Di Pendina, Lionel Torres, David Dangla, et al.. SEU Mechanisms in Spintronic Devices: Critical Parameters and Basic Effects. RADECS 2020 - 20th European Conference on Radiation and its Effects on Components and Systems, Oct 2020, Online, France. ⟨lirmm-02957096⟩

Export

BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite

Collections

CEA UGA CNRS LIRMM ADAC LIRMM_MIC MIC MIPS UNIV-MONTPELLIER CEA-DRF IRIG CEA-GRE
151 View
0 Download

Share

More