SEU Mechanisms in Spintronic Devices: Critical Parameters and Basic Effects - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2020

SEU Mechanisms in Spintronic Devices: Critical Parameters and Basic Effects

Abstract

The paper investigates radiation-induced switching mechanisms, temperature effects, breakdown voltage, sensitive volume and critical charge definitions for Spin-Transfer Torque Magnetic Tunnel Junction.
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Dates and versions

lirmm-02957096 , version 1 (04-10-2020)

Identifiers

  • HAL Id : lirmm-02957096 , version 1

Cite

Odilia Coi, Nomena Andrianjohany, Gregory Di Pendina, Lionel Torres, David Dangla, et al.. SEU Mechanisms in Spintronic Devices: Critical Parameters and Basic Effects. RADECS 2020 - 20th European Conference on Radiation and its Effects on Components and Systems, Oct 2020, Online, France. ⟨lirmm-02957096⟩
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