Approximate Computing: A Survey, IEEE Design & Test, vol.33, issue.1, pp.8-22, 2016. ,
Exploring the use of approximate TMR to mask transient faults in logic with low area overhead, Microelectronics Reliability, vol.55, issue.9-10, pp.2072-2076, 2015. ,
Error Mitigation Using Approximate Logic Circuits: A Comparison of Probabilistic and Evolutionary Approaches, IEEE Transactions on Reliability, vol.65, issue.4, pp.1871-1883, 2016. ,
Configurable-accuracy approximate adder design with light-weight fast convergence error recovery circuit, 2017 IEEE Jordan Conference on Applied Electrical Engineering and Computing Technologies (AEECT), pp.1-6, 2017. ,
A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively Harden Logic Circuits, Journal of Electronic Testing, vol.33, issue.1, pp.25-36, 2017. ,
URL : https://hal.archives-ouvertes.fr/hal-01444734
EvoApprox8b: Library of Approximate Adders and Multipliers for Circuit Design and Benchmarking of Approximation Methods, Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017, pp.258-261, 2017. ,
Integrated RF-CMOS Transceivers challenge RF Test, 2006 IEEE International Test Conference, 2006. ,
Machine learning applications in IC testing, 2018 IEEE 23rd European Test Symposium (ETS), pp.1-10, 2018. ,
URL : https://hal.archives-ouvertes.fr/hal-02369135
Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits, Journal of Electronic Testing, vol.36, issue.2, pp.189-203, 2020. ,
Implementing indirect test of RF circuits without compromising test quality: a practical case study, 2020 IEEE Latin-American Test Symposium (LATS), pp.1-6, 2020. ,
Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATE, 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), pp.1-6, 2018. ,
URL : https://hal.archives-ouvertes.fr/lirmm-01997910
Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition, 2019 IEEE European Test Symposium (ETS), pp.1-6, 2019. ,
URL : https://hal.archives-ouvertes.fr/lirmm-02274367
A Survey on Security Threats and Countermeasures in IEEE Test Standards, IEEE Design & Test, vol.36, issue.3, pp.95-116, 2019. ,
URL : https://hal.archives-ouvertes.fr/hal-02166858
Preventing Scan Attacks on Secure Circuits Through Scan Chain Encryption, IEEE, 2018. ,
URL : https://hal.archives-ouvertes.fr/lirmm-01867245
A new secure stream cipher for scan chain encryption, 2018. ,
URL : https://hal.archives-ouvertes.fr/lirmm-01867256
Stream vs block ciphers for scan encryption, Microelectronics Journal, vol.86, pp.65-76, 2019. ,
URL : https://hal.archives-ouvertes.fr/lirmm-02306938