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Smart selection of indirect parameters for DC-based alternate RF IC testing, 2012 IEEE 30th VLSI Test Symposium (VTS), pp.19-24, 2012. ,
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Test and Calibration of RF Circuits Using Built-in Non-intrusive Sensors, 2015 IEEE Computer Society Annual Symposium on VLSI, pp.627-627, 2015. ,
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A Framework for Efficient Implementation of Analog/RF Alternate Test with Model Redundancy, 2015 IEEE Computer Society Annual Symposium on VLSI, pp.621-626, 2015. ,
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Machine learning applications in IC testing, 2018 IEEE 23rd European Test Symposium (ETS), p.10, 2018. ,
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Which metrics to use for RF indirect test strategy?, 2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), p.4, 2019. ,
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On the use of causal feature selection in the context of machine-learning indirect test, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), pp.276-279, 2019. ,
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Dynamic Analog/RF Alternate Test Strategies Based on On-chip Learning, Journal of Electronic Testing, vol.34, issue.3, pp.337-349, 2018. ,
Use of ensemble methods for indirect test of RF circuits: can it bring benefits?, 2019 IEEE Latin American Test Symposium (LATS), pp.1-6, 2019. ,
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