I. Kore, B. Schuffenhauer, F. Demmerle, F. Neugebauer, G. Pfahl et al., Multi-site test of RF transceivers on low-cost digital ATE, 2011 IEEE International Test Conference, pp.1-10, 2011.

C. H. Peng, C. Yang, A. Tsu, C. Tsai, Y. Chen et al., A novel RF self test for a combo SoC on digital ATE with multi-site applications, 2014 International Test Conference, p.8, 2014.

M. Ishida and K. Ichiyama, An ATE System for Testing RF Digital Communication Devices With QAM Signal Interfaces, IEEE Design & Test, vol.33, issue.6, pp.15-22, 2016.

N. Pous, F. Azaïs, L. Latorre, and J. Rivoir, A Level-Crossing Approach for the Analysis of RF Modulated Signals Using Only Digital Test Resources, Journal of Electronic Testing, vol.27, issue.3, pp.289-303, 2011.
URL : https://hal.archives-ouvertes.fr/lirmm-00702746

S. David-grignot, F. Azais, L. Latorre, and F. Lefevre, Low-cost phase noise testing of complex RF ICs using standard digital ATE, 2014 International Test Conference, p.9, 2014.
URL : https://hal.archives-ouvertes.fr/lirmm-01119356

J. Huang and K. Cheng, An on-chip short-time interval measurement technique for testing high-speed communication links, Proc. IEEE VLSI Test Symposium (VTS), pp.380-385, 2001.

S. Sunter and A. Roy, On-chip digital jitter measurement, from megahertz to gigahertz, IEEE Design and Test of Computers, vol.21, issue.4, pp.314-321, 2004.

T. Vayssade, F. Azais, L. Latorre, and F. Lefevre, Low-Cost Digital Test Solution for Symbol Error Detection of RF ZigBee Transmitters, IEEE Transactions on Device and Materials Reliability, vol.19, issue.1, pp.16-24, 2019.
URL : https://hal.archives-ouvertes.fr/lirmm-02077048

T. Vayssade, F. Azais, L. Latorre, and F. Lefevre, Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition, 2019 IEEE European Test Symposium (ETS), p.6, 2019.
URL : https://hal.archives-ouvertes.fr/lirmm-02274367