Prediction of analog performance parameters using fast transient testing, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.21, issue.3, pp.349-361, 2002. ,
Combining Internal Probing with Artificial Neural Networks for Optimal RFIC Testing, 2006 IEEE International Test Conference, p.9, 2006. ,
URL : https://hal.archives-ouvertes.fr/hal-00369455
Sensors for built-in alternate RF test, 2010 15th IEEE European Test Symposium, pp.49-54, 2010. ,
URL : https://hal.archives-ouvertes.fr/hal-00558886
Improving the Accuracy of RF Alternate Test Using Multi-VDD Conditions: Application to Envelope-Based Test of LNAs, 2011 Asian Test Symposium, pp.359-364, 2011. ,
Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing, 2014 15th Latin American Test Workshop - LATW, vol.6, 2014. ,
URL : https://hal.archives-ouvertes.fr/lirmm-01119361
Active Learning Using Support Vector Machine, Chapman & Hall/CRC Computer Science & Data Analysis, pp.83-102, 2004. ,