Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment
Abstract
This study investigates the response of SDRAMs to electron irradiation. Stuck bits, SEUs and memory cell degradation is presented in this paper, in a memory that will be part of the ESA JUICE mission.
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2020___NSREC___Electron_induced_upsets_and_stuck_bits_in_SDRAM___HAL_Version.pdf (627.5 Ko)
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