Emerging Computing Devices: Challenges and Opportunities for Test and Reliability - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2021

Emerging Computing Devices: Challenges and Opportunities for Test and Reliability

Alberto Bosio
Ian O'Connor
Muhammad Shafique
  • Function : Author
  • PersonId : 1113530
Said Hamdioui
  • Function : Author
  • PersonId : 1113531
Koen Bertels
  • Function : Author
  • PersonId : 1113532

Abstract

The paper addresses some of the opportunities and challenges related to test and reliability of three major emerging computing paradigms; i.e., Quantum Computing, Computing engines based on Deep Neural Networks for AI, and Approximate Computing (AxC). We present a quantum accelerator showing that it can be done even without the presence of very good qubits. Then, we present Dependability for Arti)cial Intelligence (AI) oriented Hardware. Indeed, AI applications shown relevant resilience properties to faults, meaning that the testing strongly depends on the application behavior rather than on the hardware structure. We will cover AI hardware design issues due to manufacturing defects, aging faults, and soft errors. Finally, We present the use of AxC to reduce the cost of hardening a digital circuit without impacting its reliability. In other words how to go beyond usual modular redundancy scheme.
Fichier principal
Vignette du fichier
Emerging_Computing_Devices_Challenges_and_Opportunities_for_Test_and_Reliability.pdf (3.47 Mo) Télécharger le fichier

Dates and versions

lirmm-03379074 , version 1 (14-10-2021)

Identifiers

Cite

Alberto Bosio, Ian O'Connor, Marcello Traiola, Jorge Echavarria, Jürgen Teich, et al.. Emerging Computing Devices: Challenges and Opportunities for Test and Reliability. ETS 2021 - 26th IEEE European Test Symposium, May 2021, Bruges, Belgium. pp.1-10, ⟨10.1109/ETS50041.2021.9465409⟩. ⟨lirmm-03379074⟩
111 View
269 Download

Altmetric

Share

Gmail Mastodon Facebook X LinkedIn More