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Conference Papers Year : 2020

A Novel Test Flow for Approximate Digital Circuits

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Micro and nanotechnologies/Microelectronics
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Submitted on : Friday, February 17, 2023-9:28:50 AM

Last modification on : Friday, March 24, 2023-2:53:31 PM

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lirmm-03993654 , version 1 (17-02-2023)

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Marcello Traiola, Arnaud Virazel, Patrick Girard, Mario Barbareschi, Alberto Bosio. A Novel Test Flow for Approximate Digital Circuits. DATE 2020 - EDAA/IEEE/ACM Design Automation & Test in Europe Conference, PhD Forum, Mar 2020, Grenoble, France. ⟨lirmm-03993654⟩

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CNRS LIRMM TEST LIRMM_MIC MIC MIPS UNIV-MONTPELLIER EC_LYON_STRICT
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