Experimental Assessment and Biaffine Modeling of the Impact of Ambient Temperature on SoC Power Requirements - Laboratoire Traitement et Communication de l'Information Access content directly
Conference Papers Year : 2024

Experimental Assessment and Biaffine Modeling of the Impact of Ambient Temperature on SoC Power Requirements

Abstract

Based on fundamental physics-based considerations, we introduce the Biaffine Temperature-Voltage power model (BiTV) for SoC systems, which takes the influence of dynamic voltage, frequency, and ambient temperature conditions into account. Using an ARM-Cortexbased AM572x system operating in a temperature-controlled oven, we provide experimental evidence of the validity of the BiTV power model over a significant range of ambient temperatures (25 to 55 °C), voltages (0.98 to 1.23 V) and frequencies (100 to 1,500 MHz). These experiments and the BiTV model provide quantitative elements to assess the impact of ambient temperature on systems’ performance. Such insights could be of use to system designers and compiler writers, in particular when dealing with embedded systems operating in harsh conditions or under energy-critical constraints.
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Dates and versions

hal-04604958 , version 1 (07-06-2024)
hal-04604958 , version 2 (16-06-2024)

Identifiers

  • HAL Id : hal-04604958 , version 1

Cite

Kameswar Rao Vaddina, Florian Brandner, Gérard Memmi, Pierre Jouvelot. Experimental Assessment and Biaffine Modeling of the Impact of Ambient Temperature on SoC Power Requirements. SAMOS 2024 : International Conference on Embedded Computer Systems: Architectures, Modeling and Simulation, Jun 2024, Samos (Greece), Greece. ⟨hal-04604958v1⟩
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