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 Smart Integrated Electronic Systems

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One bit acquisition Carbon nanotubes Test efficiency Integrated circuit testing Automatic test pattern generation OQPSK Phase shifter Hardware security Test Noise Design Pattern recognition Current mirror Education Circuit simulation Transistors Side-channel analysis Neuromorphic computing SEU Digital signal processing Hardware Interconnects Digital ATE Calibration Ensemble methods Fault tolerance Microprocessors Self-oscillations Logic gates Power demand Delays Computer Beyond-CMOS devices Test cost reduction RF test Noise measurement Electronic tagging Oscillatory neural networks ONN Self-heating Magnetic tunneling EVM measurement 1-bit acquisition RF integrated circuits Security Copper Integrated circuit reliability RSA Phase noise Alternate testing Monitoring Circuit faults Integrated circuit modeling Process variability FDSOI technology Indirect testing Switches Indirect test Quantum Machine-learning algorithms Low-cost measurements Fault attacks Sensors Test confidence Bandwidth Integrated circuits Computer architecture Technology computer-aided design TCAD Performance Power supplies Interconnect Vanadium dioxide Electrothermal simulation EM fault injection SRAM Analog signals Bioimpedance spectroscopy Analog/RF integrated circuits Quantum computing Mutual information MEMS Secure IC Integrated circuit interconnections Insulator-Metal-Transition IMT Carbon nanotube Reliability Integrated circuit design Bioimpedance 3D integration Through-silicon vias CMOS Integrated circuit noise Edge artificial intelligence edge AI ZigBee Low power Biosensor Three-dimensional displays 3D Clocks Electrothermal analysis Evaluation