Logic gates Temperature distribution Oscillatory neural networks ONN Analog and RF integrated circuits Machine-learning algorithms Side-channel analysis Accelerometer Reliability Security Integrated circuit reliability ZigBee Quantum computing Alternate test Carbon nanotubes Three-dimensional integrated circuits 3D integration Analog/RF integrated circuits SRAM Education Calibration Indirect testing Interconnects Test cost reduction RF test Process variability Analytical models Time-domain analysis Interconnect Noise measurement Integrated circuit noise OQPSK Evaluation Microprocessors Thermal sensor Integrated circuit interconnections Advanced PMA STT-MRAM Integrated circuit design 1-bit acquisition Three-dimensional displays Fault tolerance SEU BIST Magnetic tunneling Indirect test Design Carbon nanotube Sensors Vanadium dioxide Electrothermal analysis Low-cost measurements One bit acquisition Electrothermal simulation Low power Phase shifter Neuromorphic computing Phase noise RF integrated circuits Analog signals Analog/IF signals Through-silicon vias Secure IC Noise Clocks Digital ATE Monitoring Ensemble methods CMOS Bioimpedance Edge artificial intelligence edge AI Specifications Switches ATE programming Bioimpedance spectroscopy Bandwidth Test confidence MEMS Self-heating Circuit faults 3D Alternate testing Technology computer-aided design TCAD Digital signal processing Power demand Pattern recognition Automatic test pattern generation Beyond-CMOS devices Transistors Integrated circuits Test Computer architecture Copper FDSOI technology Test efficiency Integrated circuit testing Power supplies RSA Self-oscillations Delays Circuit simulation Integrated circuit modeling