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SMARTIES
Smart Integrated Electronic Systems
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Journal title or ISSN
Publisher
Number of Files
235
Nomber of Notices
145
Collaborations’ map
Tags
Error mitigation
Digital signal processing
Hardware security
Hardware
Insulator-Metal-Transition IMT
Fault tolerance
ASCAD
Self-oscillations
Integrated circuit noise
Performance
Digital ATE
Edge artificial intelligence edge AI
Evaluation
Analog signals
EM fault injection
ADC
Magnetic tunneling
Microprocessors
Current mirror
Vanadium dioxide
Analog/RF integrated circuits
Alternate testing
Phase noise
SRAM
OQPSK
Three-dimensional integrated circuits
FDSOI technology
Electrothermal simulation
Deep learning
Bioimpedance
Machine-learning algorithms
Oscillatory Neural Networks
Advanced PMA STT-MRAM
Beyond-CMOS devices
3D integration
Energy
Noise
RSA
Quantum computing
Low-cost measurements
Transistors
MEMS
Integrated circuit testing
Oscillatory neural network
SEU
Switches
Phase shifter
Test
Convective accelerometer
Automatic test pattern generation
Logic gates
Technology computer-aided design TCAD
Quantum
Calibration
1-bit acquisition
Test efficiency
RF integrated circuits
Ensemble methods
Process variability
Circuit simulation
Carbon nanotube
Reliability
Carbon nanotubes
Computer architecture
Test cost reduction
Power demand
Noise measurement
Edge AI
Delays
Circuit faults
Bio-logging
Fault attacks
Test confidence
Indirect test
Bioimpedance spectroscopy
Specifications
Oscillatory neural networks ONN
Oscillatory Neural Network
Pattern recognition
RF test
Sensors
Indirect testing
Qubit
Through-silicon vias
Interconnects
Image Edge Detection
ATE programming
One bit acquisition
Mutual information
Integrated circuit modeling
Electronic tagging
Integrated circuits
Neuromorphic computing
Side-channel analysis
Low-power
Three-dimensional displays
Education
Self-heating
ZigBee
Time-domain analysis