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 Smart Integrated Electronic Systems

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Electromigration Competencies Calibration Low-cost measurements Critical path delay Integrated circuit reliability Power supply noise Through-silicon vias Low power Carbon nanotubes Bioimpedance Automatic test pattern generation RSA Test efficiency Analog/RF integrated circuits CMOS Time-domain analysis Delay variation Digital ATE Noise measurement Reliability Monitoring One bit acquisition SER Accelerometer Automatic test pattern generation ATPG Integrated circuit modeling Switches SEU AES Microprocessors Process variability Three-dimensional integrated circuits Electrothermal analysis SRAM Phase shifter 1-bit acquisition Soft errors Correlation Analog and RF integrated circuits Circuits EM injection Specifications Power supplies Circuit Alternate test Test cost reduction Integrated circuit testing Test Alternate testing Analog/IF signals Three-dimensional displays Embedded System Design for testability BIST Data fusion Secure IC Carbon nanotube interconnects Thermal sensor Power demand Side-channel analysis Copper Logic gates Transistors 3D integration Evaluation Digital signal processing Capacitors 3D Circuit faults Brainstorming Through-silicon-vias Education Bandwidth Sensors Capacitance COTS Computer architecture Electronic Implant Magnetic tunneling Analytical models Convective accelerometer Biosensor Discharges electric Heating Integrated circuit noise Accelerometers Integrated circuit design Indirect testing MEMS Integrated circuit interconnections Phase noise Built-In-Self-Test Noise Integrated circuits Clocks Analog signals Delays Design ATE programming