index - Smart Integrated Electronic Systems Access content directly



 Smart Integrated Electronic Systems

Consult your copyright

Number of Files


Nomber of Notices


Collaborations’ map


RF integrated circuits Energy Time-domain analysis Vanadium dioxide SEU Integrated circuit testing Neuromorphic computing Hardware Digital signal processing Process variability Ensemble methods Automatic test pattern generation Education Quantum ASCAD Test confidence EM fault injection Deep learning Performance Self-oscillations Circuit simulation Carbon nanotubes Pattern recognition Analog/RF integrated circuits 3D integration Error mitigation Current mirror OQPSK Magnetic tunneling RF test Fault tolerance Switches Phase noise Electronic tagging ZigBee ADC Qubit Oscillatory neural network Evaluation Technology computer-aided design TCAD Bioimpedance spectroscopy Analog signals Bio-logging Side-channel analysis Three-dimensional integrated circuits Oscillatory Neural Network Quantum computing Mutual information Phase shifter Computer architecture Bioimpedance Oscillatory Neural Networks Specifications ATE programming Convective accelerometer Integrated circuit modeling Reliability Integrated circuit noise Indirect test Interconnects Low-cost measurements Edge artificial intelligence edge AI Insulator-Metal-Transition IMT One bit acquisition Electrothermal simulation Delays FDSOI technology Low-power 1-bit acquisition Self-heating MEMS Power demand Circuit faults Sensors Machine-learning algorithms Oscillatory neural networks ONN Alternate testing Calibration Image Edge Detection Beyond-CMOS devices Edge AI Through-silicon vias Test cost reduction Digital ATE Noise measurement Hardware security Transistors SRAM Test efficiency NP-hard problems Logic gates Microprocessors Noise Test RSA Fault attacks Indirect testing Three-dimensional displays Integrated circuits Carbon nanotube