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 Smart Integrated Electronic Systems

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Integrated circuit modeling Three-dimensional displays CMOS memory circuits Analytical models FDSOI technology Magnetic tunneling Power supplies Design Advanced PMA STT-MRAM EM injection Carbon nanotubes Analog and RF integrated circuits Carbon nanotube interconnects Specifications Transistors Secure IC Logic gates Critical path delay Biosensor Cache storage Analog/IF signals Convective accelerometer Alternate test Test cost reduction MEMS SRAM Energy Copper Capacitors Delays BIST Test efficiency 1-bit acquisition Circuit Time-domain analysis Noise Test Clocks Fault Injection Integrated circuits Through-silicon vias Accelerometers Phase shifter Data fusion Analog/RF integrated circuits RSA Accelerometer Low-cost measurements Integrated circuit testing Automatic test pattern generation Low power 3D integration Fault attacks Bandwidth Reliability Error analysis Computer architecture Correlation CMOS Brainstorming Bioimpedance spectroscopy Embedded System Alternate testing Process variability Delay variation COTS Side-channel analysis Bioimpedance Switches Calibration Noise measurement ATE programming Circuit faults Microprocessors Power demand Phase noise Monitoring Integrated circuit interconnections Integrated circuit noise Built-In-Self-Test SEU Electromigration Thermal sensor Digital signal processing One bit acquisition Sensors Analog signals Education Integrated circuit design Competencies Three-dimensional integrated circuits AES Digital ATE Circuits Electronic Implant Indirect testing 3D Heating Electrothermal analysis Evaluation