Circuit faults ATE programming Interconnects Test confidence Bioimpedance Ensemble methods Through-silicon vias Analog/IF signals Integrated circuit reliability Bioimpedance spectroscopy SRAM Integrated circuit testing Digital ATE Test efficiency Built-In-Self-Test 1-bit acquisition Advanced PMA STT-MRAM COTS Machine-learning algorithms Capacitors Analog/RF integrated circuits Sensors Secure IC Magnetic tunneling ZigBee Low power Test Computer architecture Indirect testing Side-channel analysis Transistors SEU Evaluation Analog and RF integrated circuits CMOS memory circuits Biosensor Three-dimensional integrated circuits Correlation Circuit CMOS Education Analytical models Clocks Integrated circuit design MEMS OQPSK Monitoring Automatic test pattern generation 3D Carbon nanotube interconnects Convective accelerometer Competencies Process variability Integrated circuits RF test Low-cost measurements Brainstorming Calibration Integrated circuit interconnections Phase noise Time-domain analysis Noise FDSOI technology Switches Accelerometer RF integrated circuits Specifications Alternate test Reliability Power supplies Delays Interconnect Logic gates Phase shifter Test cost reduction Microprocessors Temperature distribution Integrated circuit noise Carbon nanotube RSA Three-dimensional displays Indirect test Carbon nanotube CNT Digital signal processing One bit acquisition Electrothermal analysis Noise measurement BIST Integrated circuit modeling Power demand Analog signals Design 3D integration Bandwidth Alternate testing Thermal sensor Circuits Carbon nanotubes Copper Fault tolerance