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 Smart Integrated Electronic Systems

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Error mitigation Digital signal processing Hardware security Hardware Insulator-Metal-Transition IMT Fault tolerance ASCAD Self-oscillations Integrated circuit noise Performance Digital ATE Edge artificial intelligence edge AI Evaluation Analog signals EM fault injection ADC Magnetic tunneling Microprocessors Current mirror Vanadium dioxide Analog/RF integrated circuits Alternate testing Phase noise SRAM OQPSK Three-dimensional integrated circuits FDSOI technology Electrothermal simulation Deep learning Bioimpedance Machine-learning algorithms Oscillatory Neural Networks Advanced PMA STT-MRAM Beyond-CMOS devices 3D integration Energy Noise RSA Quantum computing Low-cost measurements Transistors MEMS Integrated circuit testing Oscillatory neural network SEU Switches Phase shifter Test Convective accelerometer Automatic test pattern generation Logic gates Technology computer-aided design TCAD Quantum Calibration 1-bit acquisition Test efficiency RF integrated circuits Ensemble methods Process variability Circuit simulation Carbon nanotube Reliability Carbon nanotubes Computer architecture Test cost reduction Power demand Noise measurement Edge AI Delays Circuit faults Bio-logging Fault attacks Test confidence Indirect test Bioimpedance spectroscopy Specifications Oscillatory neural networks ONN Oscillatory Neural Network Pattern recognition RF test Sensors Indirect testing Qubit Through-silicon vias Interconnects Image Edge Detection ATE programming One bit acquisition Mutual information Integrated circuit modeling Electronic tagging Integrated circuits Neuromorphic computing Side-channel analysis Low-power Three-dimensional displays Education Self-heating ZigBee Time-domain analysis