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The SMARTIES (Smart Integrated Electronic Systems) team focuses on design methods and modeling devices, systems, and integrated circuits. These activities comprise the development of methods, tools, and principles based on physical or electrical simulation approaches. Our main contributions include work on the continuity and extension of, or break with, Moore’s law, the impact of emerging technologies (FDSOI and FINFET) on design methods or functional block architectures, integration approaches (3D stacking and 3D monolithic integration), and heterogeneous integration with novel devices (MRAM, Carbon Nanotubes) on inte-grated circuits. This research is usually paralleled by technological demonstrations (specific circuits, bench experiments, model integration in simulators, etc.), which allow us to illustrate our work with practical examples relating to the transversal research lines of the Department.

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NP-hard problems Magnetic tunneling Fault attacks Evaluation Bio-logging ZigBee Power demand Analog/RF integrated circuits Edge artificial intelligence edge AI Ensemble methods Hardware security Self-oscillations Oscillatory Neural Network Indirect testing Logic gates Phase noise Deep learning 1-bit acquisition Integrated circuit modeling Noise measurement Self-heating SRAM 3D integration MEMS Integrated circuits Circuit faults RF integrated circuits Insulator-Metal-Transition IMT Time-domain analysis Low-cost measurements Switches OQPSK Energy Education Side-channel attacks Analog signals Convective accelerometer Specifications Edge AI Error mitigation Digital ATE Bioimpedance Alternate testing Test cost reduction Electrothermal simulation Three-dimensional displays ADC Three-dimensional integrated circuits Integrated circuit testing Low-power RSA Automatic test pattern generation Hardware Oscillatory neural networks ONN Quantum computing Oscillatory neural network Sensors Pattern recognition Process variability Through-silicon vias Bioimpedance spectroscopy Digital signal processing Test efficiency FDSOI technology Calibration Beyond-CMOS devices Integrated circuit noise Quantum Countermeasures Reliability Test Electronic tagging Indirect test Delays Image Edge Detection Vanadium dioxide Interconnects Fault tolerance Test confidence Noise Performance RF test Microprocessors Circuit simulation Mutual information Oscillatory Neural Networks Phase shifter One bit acquisition Current mirror Technology computer-aided design TCAD Side-channel analysis SEU Machine-learning algorithms Carbon nanotube Carbon nanotubes Computer architecture Neuromorphic computing Qubit EM fault injection Transistors