index - Smart Integrated Electronic Systems

The SMARTIES (Smart Integrated Electronic Systems) team focuses on design methods and modeling devices, systems, and integrated circuits. These activities comprise the development of methods, tools, and principles based on physical or electrical simulation approaches. Our main contributions include work on the continuity and extension of, or break with, Moore’s law, the impact of emerging technologies (FDSOI and FINFET) on design methods or functional block architectures, integration approaches (3D stacking and 3D monolithic integration), and heterogeneous integration with novel devices (MRAM, Carbon Nanotubes) on inte-grated circuits. This research is usually paralleled by technological demonstrations (specific circuits, bench experiments, model integration in simulators, etc.), which allow us to illustrate our work with practical examples relating to the transversal research lines of the Department.


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Switches One bit acquisition Test cost reduction Bio-logging Energy Automatic test pattern generation Beyond-CMOS devices Reliability Qubit Performance Technology computer-aided design TCAD Integrated circuit modeling Test Image edge detection Through-silicon vias Process variability CMOS analog design OQPSK Fault model Logic gates Ensemble methods Test confidence Digital ATE Oscillatory Neural Networks Edge artificial intelligence edge AI EM fault injection Self-heating Hardware Electronic tagging Computer architecture Countermeasures Alternate testing Insulator-Metal-Transition IMT Security Phase noise Quantum computing Vanadium dioxide Neuromorphic computing Delays Analog signals Indirect testing Impedance RF integrated circuits Error mitigation Low-cost measurements Transistors Pattern recognition Mutual information FDSOI technology Deep learning Evaluation Three-dimensional displays Integrated circuit noise Microcontrollers Carbon nanotube Edge AI Side-channel attacks Noise measurement High-current drive Image Edge Detection Machine-learning algorithms Interconnects Oscillatory neural network Bioimpedance Digital signal processing RF test SRAM Fault attacks Simulation Oscillatory neural networks ONN Hardware security Sensors Low-power Oscillatory Neural Network Magnetic tunneling Circuit simulation Fault tolerance Noise Phase shifter Electrothermal simulation Side-channel analysis ZigBee Circuit faults Current conveyor Microprocessors NP-hard problems MEMS Education Bioimpedance spectroscopy 3D integration Test efficiency Integrated circuits Integrated circuit testing Calibration Current mirror Convective accelerometer Carbon nanotubes Analog/RF integrated circuits Indirect test 1-bit acquisition