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 Smart Integrated Electronic Systems

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Beyond-CMOS devices Digital ATE Edge artificial intelligence edge AI RF test Analog/RF integrated circuits Evaluation 3D integration Phase shifter Fault tolerance Alternate test FDSOI technology Microprocessors Advanced PMA STT-MRAM BIST Specifications CMOS Education Delays Test efficiency Self-oscillations Digital signal processing Built-In-Self-Test Electrothermal simulation Quantum Magnetic tunneling Performance SRAM Computer architecture One bit acquisition ATE programming Circuit faults EM fault injection Switches RSA Bio-logging Time-domain analysis Indirect test Integrated circuit testing Pattern recognition OQPSK Carbon nanotube Ensemble methods Current mirror Noise measurement Computer Analog and RF integrated circuits Integrated circuit noise Oscillatory Neural Network Power demand Hardware Test confidence Indirect testing Fault attacks Process variability Sensors Machine-learning algorithms Qubit Test SEU Phase noise Noise Bandwidth Calibration Technology computer-aided design TCAD Hardware security Three-dimensional displays Self-heating ZigBee Reliability Test cost reduction Carbon nanotubes Alternate testing Transistors Neuromorphic computing Electronic tagging Low-cost measurements Oscillatory Neural Networks Automatic test pattern generation Circuit simulation 1-bit acquisition CMOS analog design ADC MEMS Integrated circuits Vanadium dioxide Interconnects RF integrated circuits Side-channel analysis Oscillatory neural networks ONN Three-dimensional integrated circuits Insulator-Metal-Transition IMT Biosensor Integrated circuit modeling Analog/IF signals Analog signals Through-silicon vias Bioimpedance spectroscopy Bioimpedance Quantum computing Logic gates