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 Smart Integrated Electronic Systems

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Integrated circuits Alternate test Test Clocks Analytical models Automatic test pattern generation Integrated circuit noise Analog and RF integrated circuits 1-bit acquisition Computer architecture COTS Phase noise OQPSK Side-channel analysis Time-domain analysis ATE programming Test efficiency Test confidence Convective accelerometer Thermal sensor Specifications Transistors SRAM Competencies Design Circuit Carbon nanotube Analog/RF integrated circuits Advanced PMA STT-MRAM Digital signal processing Evaluation Calibration Noise Reliability 3D Logic gates Process variability Bioimpedance spectroscopy Circuits Phase shifter Built-In-Self-Test Three-dimensional integrated circuits Correlation ZigBee CMOS Biosensor Carbon nanotube interconnects Magnetic tunneling BIST Temperature distribution Ensemble methods Power supplies Interconnects Carbon nanotube CNT Electrothermal analysis Copper Sensors Integrated circuit reliability RSA Power demand Low power Integrated circuit modeling Analog/IF signals Indirect testing Monitoring Carbon nanotubes Microprocessors Education Brainstorming Integrated circuit testing Integrated circuit design 3D integration Capacitors Test cost reduction Secure IC One bit acquisition Bioimpedance Alternate testing Accelerometer FDSOI technology Low-cost measurements Analog signals Digital ATE Delays Through-silicon vias Switches SEU Fault tolerance CMOS memory circuits MEMS Three-dimensional displays Noise measurement Circuit faults RF test Interconnect Integrated circuit interconnections Indirect test Bandwidth RF integrated circuits Machine-learning algorithms