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 Smart Integrated Electronic Systems

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Integrated circuit reliability Ensemble methods Microprocessors Vanadium dioxide Sensors ZigBee Analog/RF integrated circuits Monitoring Machine-learning algorithms EM fault injection Technology computer-aided design TCAD Indirect testing EVM measurement RSA Test efficiency Power demand Carbon nanotube Design One bit acquisition Power supplies Integrated circuit noise Security 3D integration Copper Bioimpedance spectroscopy Carbon nanotubes 3D SRAM Temperature distribution FDSOI technology Indirect test Quantum computing RF test Test confidence Oscillatory neural networks ONN Biosensor Electrothermal simulation Side-channel analysis Noise Three-dimensional displays 1-bit acquisition Transistors Test Integrated circuit modeling Electrothermal analysis Automatic test pattern generation RF integrated circuits Self-heating Test cost reduction OQPSK Low power Education Fault attacks Integrated circuit interconnections Clocks CMOS Magnetic tunneling Self-oscillations Fault tolerance Interconnect Integrated circuit design Digital signal processing Evaluation Low-cost measurements Insulator-Metal-Transition IMT Beyond-CMOS devices Hardware security Noise measurement Hardware Electronic tagging MEMS Current mirror Interconnects Integrated circuit testing Computer architecture Edge artificial intelligence edge AI Through-silicon vias SEU Specifications Bioimpedance Delays Logic gates Bandwidth Secure IC Performance Alternate testing Phase noise Integrated circuits Pattern recognition Circuit faults Reliability Switches Process variability Digital ATE Neuromorphic computing Phase shifter Circuit simulation Calibration Mutual information Analog signals