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SmartIES:

 Smart Integrated Electronic Systems

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177

Tags

Specifications Integrated circuit reliability AES EM injection Switches Education Automatic test pattern generation Brainstorming 3D integration Monitoring Secure IC Test cost reduction Through-silicon vias Time-domain analysis Noise Bioimpedance One bit acquisition 1-bit acquisition CMOS Indirect testing SER Correlation Integrated circuit modeling Analog/RF integrated circuits Carbon nanotubes Accelerometer Thermal sensor Through-silicon-vias Test Analog and RF integrated circuits Integrated circuit noise Alternate test Transistors Carbon nanotube interconnects Low-cost measurements Sensors Circuits Copper Reliability Integrated circuits COTS Electrothermal analysis Capacitors Electronic Implant Power supply noise Noise measurement Side-channel analysis Integrated circuit design Analog signals Integrated circuit interconnections SEU Digital ATE CMOS technology Built-In-Self-Test Circuit Heating Alternate testing Delays Electromigration Analytical models Automatic test pattern generation ATPG Evaluation Integrated circuit testing Analog/IF signals Critical path delay Soft errors Accelerometers Microprocessors BIST Power consumption Convective accelerometer Delay variation SRAM Logic gates Bandwidth Design ATE programming Three-dimensional integrated circuits Three-dimensional displays Low power Clocks Test efficiency Power supplies Phase shifter Capacitance Phase noise Digital signal processing Magnetic tunneling Design for testability Circuit faults RSA Competencies Temperature distribution MEMS Computer architecture Discharges electric Power demand Calibration 3D Data fusion