index - Smart Integrated Electronic Systems Access content directly



 Smart Integrated Electronic Systems

Consult your copyright

Number of Files


Nomber of Notices


Collaborations’ map


Integrated circuits RF integrated circuits Digital signal processing Automatic test pattern generation Interconnects Quantum Ensemble methods Circuit faults Edge artificial intelligence edge AI Indirect test Advanced PMA STT-MRAM EM fault injection ATE programming Self-heating MEMS Process variability Phase shifter Test cost reduction Integrated circuit modeling Test confidence Analog signals Neuromorphic computing Analog and RF integrated circuits Bioimpedance spectroscopy Switches Alternate testing SEU Associative memory Alternate test Integrated circuit testing Insulator-Metal-Transition IMT FDSOI technology SRAM Low-cost measurements OQPSK Sensors 1-bit acquisition Through-silicon vias Bioimpedance Analog/IF signals One bit acquisition Quantum computing Qubit Side-channel analysis Electronic tagging Pattern recognition Reliability Performance Image Edge Detection Microprocessors Oscillatory Neural Networks Delays Phase noise Test Magnetic tunneling Technology computer-aided design TCAD Electrothermal simulation Calibration Analog/RF integrated circuits Vanadium dioxide Noise Test efficiency Hardware security Circuit simulation 3D integration Logic gates ZigBee Digital ATE Edge AI Fault tolerance ADC Specifications Audio Oscillatory Neural Network Time-domain analysis Convective accelerometer Self-oscillations RF test Carbon nanotube Three-dimensional displays RSA Three-dimensional integrated circuits Oscillatory neural networks ONN Carbon nanotubes Current mirror Noise measurement Integrated circuit noise Bio-logging Transistors Hardware Error mitigation Evaluation Computer architecture Education Power demand Energy Fault attacks Beyond-CMOS devices Machine-learning algorithms Indirect testing