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 Smart Integrated Electronic Systems

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Switches Test COTS Phase shifter Electromigration Low-cost measurements Integrated circuit interconnections Discharges electric Delay variation Test efficiency Integrated circuit design Computer architecture Noise Circuit faults Accelerometers Thermal sensor Power supply noise Side-channel analysis Noise measurement Three-dimensional displays Embedded System RSA Brainstorming Data fusion Circuit Integrated circuit modeling SEU Bioimpedance Digital signal processing Three-dimensional integrated circuits Correlation Evaluation Sensors Automatic test pattern generation ATPG Analog/IF signals Power demand Automatic test pattern generation 1-bit acquisition Alternate testing Through-silicon vias Built-In-Self-Test Critical path delay Electrothermal analysis Calibration SRAM BIST Indirect testing MEMS Design for testability Magnetic tunneling EM injection Education Through-silicon-vias Soft errors Analog signals Bandwidth 3D Clocks Accelerometer Logic gates Specifications Error analysis Alternate test Integrated circuits AES Integrated circuit noise Carbon nanotube interconnects One bit acquisition Capacitance CMOS Analog and RF integrated circuits Fault Injection Analog/RF integrated circuits Microprocessors Reliability Phase noise Test cost reduction Copper Analytical models 3D integration ATE programming Power supplies Low power Integrated circuit testing Capacitors SER Electronic Implant Heating Monitoring Convective accelerometer Time-domain analysis Design Delays Integrated circuit reliability Secure IC Carbon nanotubes Digital ATE Transistors Competencies Circuits