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The SMARTIES (Smart Integrated Electronic Systems) team focuses on design methods and modeling devices, systems, and integrated circuits. These activities comprise the development of methods, tools, and principles based on physical or electrical simulation approaches. Our main contributions include work on the continuity and extension of, or break with, Moore’s law, the impact of emerging technologies (FDSOI and FINFET) on design methods or functional block architectures, integration approaches (3D stacking and 3D monolithic integration), and heterogeneous integration with novel devices (MRAM, Carbon Nanotubes) on inte-grated circuits. This research is usually paralleled by technological demonstrations (specific circuits, bench experiments, model integration in simulators, etc.), which allow us to illustrate our work with practical examples relating to the transversal research lines of the Department.


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Process variability Ensemble methods 1-bit acquisition Transistors Three-dimensional integrated circuits Low-power Test efficiency Neuromorphic computing Qubit Analog signals Integrated circuit testing Noise measurement Indirect test ZigBee Microprocessors Education Quantum Carbon nanotube OQPSK RF test Convective accelerometer Electrothermal simulation RF integrated circuits FDSOI technology Computer architecture Oscillatory neural networks ONN Alternate testing Side-channel analysis Deep learning Pattern recognition Hardware Magnetic tunneling Self-oscillations Calibration Through-silicon vias Hardware security Countermeasures Logic gates Bioimpedance spectroscopy Integrated circuit modeling Digital ATE Automatic test pattern generation One bit acquisition ADC Oscillatory neural network 3D integration Test confidence Edge artificial intelligence edge AI Insulator-Metal-Transition IMT MEMS Time-domain analysis Test Side-channel attacks Specifications Indirect testing Quantum computing Delays Bioimpedance NP-hard problems Electronic tagging Phase shifter RSA Error mitigation Sensors EM fault injection Current mirror Machine-learning algorithms Oscillatory Neural Networks Performance Switches Noise Three-dimensional displays Vanadium dioxide Technology computer-aided design TCAD Analog/RF integrated circuits Power demand Edge AI Integrated circuits Image Edge Detection Reliability Carbon nanotubes Mutual information SRAM Integrated circuit noise Fault attacks Bio-logging Digital signal processing Phase noise Test cost reduction Oscillatory Neural Network Beyond-CMOS devices SEU Circuit simulation Energy Evaluation Low-cost measurements Fault tolerance Interconnects Circuit faults Self-heating