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SmartIES:

 Smart Integrated Electronic Systems

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166

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Integrated circuit noise Side-channel analysis Analog signals Error analysis Capacitance Convective accelerometer Monitoring Analog and RF integrated circuits Power demand Specifications Copper Test cost reduction Design for testability Carbon nanotube interconnects Capacitors Accelerometers RSA Bandwidth ATE programming Phase noise Through-silicon-vias Carbon nanotubes Fault attacks Education BIST Integrated circuit interconnections Delays Low power Power supplies Computer architecture 3D integration Built-In-Self-Test Delay variation Electronic Implant SRAM Evaluation Circuit faults Magnetic tunneling Three-dimensional integrated circuits Logic gates Digital signal processing SER Correlation Integrated circuit design Fault detection Secure IC Analog/IF signals Test Clocks Integrated circuit modeling Calibration Integrated circuit testing Noise Embedded System Through-silicon vias Competencies Circuit Transistors Accelerometer Noise measurement Design 3D SEU One bit acquisition 1-bit acquisition Three-dimensional displays Switches CMOS Indirect testing Analog/RF integrated circuits Heating Integrated circuit reliability Critical path delay CMOS technology Temperature distribution Microprocessors COTS Electrothermal analysis Phase shifter Data fusion Alternate test Reliability Brainstorming Time-domain analysis Sensors Thermal sensor Alternate testing Test efficiency Circuits EM injection Low-cost measurements Integrated circuits MEMS Analytical models AES Electromigration Power consumption Automatic test pattern generation Fault Injection Digital ATE