Skip to Main content
Skip to Navigation
Toggle navigation
HAL
HAL
HALSHS
TEL
MédiHAL
Liste des portails
AURéHAL
API
Data
Documentation
Episciences.org
Episciences.org
Journals
Documentation
Sciencesconf.org
Support
Sign in
Sign in
Sign in with ORCID
se connecter avec Fédération
Create account
Forgot your password?
Have you forgotten your login?
fr
en
SmartIES
Homepage
Deposit
Consult
by author
by period
by doctype
by journal
by conference
by ANR project
latest deposit
Evaluation
Homepage
Search
SMARTIES
Smart Integrated Electronic Systems
Consult your copyright
Titre du journal ou ISSN
Editeur
Number of Files
145
Nomber of Notices
150
Collaborations’ map
Tags
Integrated circuits
Alternate test
Test
Clocks
Analytical models
Automatic test pattern generation
Integrated circuit noise
Analog and RF integrated circuits
1-bit acquisition
Computer architecture
COTS
Phase noise
OQPSK
Side-channel analysis
Time-domain analysis
ATE programming
Test efficiency
Test confidence
Convective accelerometer
Thermal sensor
Specifications
Transistors
SRAM
Competencies
Design
Circuit
Carbon nanotube
Analog/RF integrated circuits
Advanced PMA STT-MRAM
Digital signal processing
Evaluation
Calibration
Noise
Reliability
3D
Logic gates
Process variability
Bioimpedance spectroscopy
Circuits
Phase shifter
Built-In-Self-Test
Three-dimensional integrated circuits
Correlation
ZigBee
CMOS
Biosensor
Carbon nanotube interconnects
Magnetic tunneling
BIST
Temperature distribution
Ensemble methods
Power supplies
Interconnects
Carbon nanotube CNT
Electrothermal analysis
Copper
Sensors
Integrated circuit reliability
RSA
Power demand
Low power
Integrated circuit modeling
Analog/IF signals
Indirect testing
Monitoring
Carbon nanotubes
Microprocessors
Education
Brainstorming
Integrated circuit testing
Integrated circuit design
3D integration
Capacitors
Test cost reduction
Secure IC
One bit acquisition
Bioimpedance
Alternate testing
Accelerometer
FDSOI technology
Low-cost measurements
Analog signals
Digital ATE
Delays
Through-silicon vias
Switches
SEU
Fault tolerance
CMOS memory circuits
MEMS
Three-dimensional displays
Noise measurement
Circuit faults
RF test
Interconnect
Integrated circuit interconnections
Indirect test
Bandwidth
RF integrated circuits
Machine-learning algorithms