index - Smart Integrated Electronic Systems

The SMARTIES (Smart Integrated Electronic Systems) team focuses on design methods and modeling devices, systems, and integrated circuits. These activities comprise the development of methods, tools, and principles based on physical or electrical simulation approaches. Our main contributions include work on the continuity and extension of, or break with, Moore’s law, the impact of emerging technologies (FDSOI and FINFET) on design methods or functional block architectures, integration approaches (3D stacking and 3D monolithic integration), and heterogeneous integration with novel devices (MRAM, Carbon Nanotubes) on inte-grated circuits. This research is usually paralleled by technological demonstrations (specific circuits, bench experiments, model integration in simulators, etc.), which allow us to illustrate our work with practical examples relating to the transversal research lines of the Department.


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Electrothermal simulation Machine-learning algorithms Calibration Education Indirect testing Interconnects Low-cost measurements Quantum computing Deep learning Vanadium dioxide Alternate testing Phase noise Side-channel attacks Noise Microcontrollers Beyond-CMOS devices Indirect test Reliability Energy Impedance Fault tolerance Bioimpedance Test efficiency Bioimpedance spectroscopy Quantum Automatic test pattern generation Digital signal processing Digital ATE Sensors Through-silicon vias Integrated circuit testing Electronic tagging Noise measurement CMOS analog design Microprocessors Edge AI Low-power One bit acquisition Security Pattern recognition Analog signals Circuit faults Test cost reduction Computer architecture Transistors Fault attacks FDSOI technology OQPSK Circuit simulation Hardware Security Neuromorphic computing Integrated circuit noise Hardware Process variability Three-dimensional displays Oscillatory Neural Network SRAM Integrated circuit modeling Image Edge Detection Simulation Test 3D integration Self-heating Oscillatory Neural Networks Qubit High-current drive Magnetic tunneling Insulator-Metal-Transition IMT Delays Convective accelerometer Test confidence Fault model ZigBee Carbon nanotube Integrated circuits Switches Analog/RF integrated circuits RF test Side-channel analysis Oscillatory neural networks ONN Mutual information Bio-logging Evaluation Ensemble methods Technology computer-aided design TCAD Carbon nanotubes Hardware security MEMS Error mitigation Oscillatory neural network 1-bit acquisition Image edge detection EM fault injection Current mirror Current conveyor Logic gates Countermeasures Edge artificial intelligence edge AI Performance RF integrated circuits