Alternate testing Analog/RF integrated circuits Digital signal processing Time-domain analysis Computer architecture OQPSK Sensors RF test Noise Evaluation Design Analog/IF signals RF integrated circuits Specifications Delays Magnetic tunneling Secure IC Fault tolerance Biosensor Bioimpedance Through-silicon vias 3D ATE programming Process variability Interconnects Brainstorming Test confidence Integrated circuit testing 3D integration Competencies MEMS Side-channel analysis Switches Noise measurement CMOS Thermal sensor 1-bit acquisition Analog and RF integrated circuits Calibration Copper Clocks Integrated circuit interconnections COTS Analytical models Machine-learning algorithms ZigBee Low power Power supplies Circuit faults Indirect testing Integrated circuit reliability Test cost reduction Power demand Circuit simulation Integrated circuit design SRAM Advanced PMA STT-MRAM Circuits One bit acquisition Interconnect Three-dimensional displays Carbon nanotubes Digital ATE Carbon nanotube CNT BIST SEU Automatic test pattern generation Microprocessors Phase noise Test Education Three-dimensional integrated circuits Reliability Bioimpedance spectroscopy Integrated circuits Electrothermal analysis Capacitors Integrated circuit modeling RSA Integrated circuit noise Logic gates Test efficiency Alternate test Carbon nanotube Temperature distribution Analog signals FDSOI technology Carbon nanotube interconnects Bandwidth Low-cost measurements Circuit Security Monitoring Ensemble methods Accelerometer Built-In-Self-Test Phase shifter CMOS memory circuits Indirect test Transistors