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SMARTIES
Smart Integrated Electronic Systems
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Titre du journal ou ISSN
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Number of Files
222
Nomber of Notices
148
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Tags
Integrated circuits
RF integrated circuits
Digital signal processing
Automatic test pattern generation
Interconnects
Quantum
Ensemble methods
Circuit faults
Edge artificial intelligence edge AI
Indirect test
Advanced PMA STT-MRAM
EM fault injection
ATE programming
Self-heating
MEMS
Process variability
Phase shifter
Test cost reduction
Integrated circuit modeling
Test confidence
Analog signals
Neuromorphic computing
Analog and RF integrated circuits
Bioimpedance spectroscopy
Switches
Alternate testing
SEU
Associative memory
Alternate test
Integrated circuit testing
Insulator-Metal-Transition IMT
FDSOI technology
SRAM
Low-cost measurements
OQPSK
Sensors
1-bit acquisition
Through-silicon vias
Bioimpedance
Analog/IF signals
One bit acquisition
Quantum computing
Qubit
Side-channel analysis
Electronic tagging
Pattern recognition
Reliability
Performance
Image Edge Detection
Microprocessors
Oscillatory Neural Networks
Delays
Phase noise
Test
Magnetic tunneling
Technology computer-aided design TCAD
Electrothermal simulation
Calibration
Analog/RF integrated circuits
Vanadium dioxide
Noise
Test efficiency
Hardware security
Circuit simulation
3D integration
Logic gates
ZigBee
Digital ATE
Edge AI
Fault tolerance
ADC
Specifications
Audio
Oscillatory Neural Network
Time-domain analysis
Convective accelerometer
Self-oscillations
RF test
Carbon nanotube
Three-dimensional displays
RSA
Three-dimensional integrated circuits
Oscillatory neural networks ONN
Carbon nanotubes
Current mirror
Noise measurement
Integrated circuit noise
Bio-logging
Transistors
Hardware
Error mitigation
Evaluation
Computer architecture
Education
Power demand
Energy
Fault attacks
Beyond-CMOS devices
Machine-learning algorithms
Indirect testing