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Number of Files
525
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Tags
Neutron
Memory test
Integrated circuit design
Cryptography
Memory
CMOS
Failure analysis
SEU
Accelerometer
Through-silicon vias
AES
Silicon
Random access memory
Computer architecture
Design
Sensors
Soft errors
Spintronics
Circuit testing
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ATPG
Heavy ions
SoC
SRAM
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Design space exploration
Transient faults
Accelerometers
Testing
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Single event upset SEU
Microprocessors
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Monitoring
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Neutrons
Integrated circuit interconnections
Low power
Memories
Resistive-open defects
Fault attacks
Cryptographie
Cross section
Integrated circuit testing
Switches
Security
Transistors
Magnetic tunneling
Hardware security
Robustness
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MRAM
Delay testing
Fiabilité
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Electromagnetic Analysis
Logic testing
Power demand
Estimation
BIST
Fault modeling
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Multiple cell upset MCU
Fault injection
Thermal sensor
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CMOS integrated circuits
Integrated circuit modeling
Low-power design
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Testability
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