Neutron Memory test Integrated circuit design Cryptography Memory CMOS Failure analysis SEU Accelerometer Through-silicon vias AES Silicon Random access memory Computer architecture Design Sensors Soft errors Spintronics Circuit testing Embedded systems Simulation ATPG Heavy ions SoC SRAM MEMS Hardware Design space exploration Transient faults Accelerometers Testing Modeling Delays SER Logic gates DFT Crosstalk Single event upset SEU Microprocessors DPA Noise RSA Clocks Heating Libraries Diagnostic FPGA Voltage Field programmable gate arrays Reliability Flip-flops Radiation Automatic test pattern generation Fault tolerance Hardware Trojan Monitoring Analytical models VLSI Atmospheric neutrons Neutrons Integrated circuit interconnections Low power Memories Resistive-open defects Fault attacks Cryptographie Cross section Integrated circuit testing Switches Security Transistors Magnetic tunneling Hardware security Robustness Cross-section MRAM Delay testing Fiabilité Single Event Upset Electromagnetic Analysis Logic testing Power demand Estimation BIST Fault modeling Countermeasures Circuit faults Multiple cell upset MCU Fault injection Thermal sensor Variability CMOS integrated circuits Integrated circuit modeling Low-power design Calibration Memory device Testability Power consumption Test Core-cell