Monitoring MEMS Variability Crosstalk SEU SoC Circuit faults Single event upset SEU Clocks 3D Soft errors Libraries Accelerometers Soft Error Rate CMOS integrated circuits Random access memory Embedded systems Memories Computer architecture Security Sensor Test Fiabilité Cryptography Heating Transistors AES Fault attacks Hardware Hardware Trojan Hardware security Failure analysis Robustness Logic testing Low power Modeling Integrated circuit testing Integrated circuit modeling Integrated circuit design Transient faults Cross section Calibration Cross-section Analytical models Memory device Switches Low-power design BIST SRAM Temperature distribution Memory Neutron Integrated circuit interconnections Diagnostic Spintronics Fault modeling Testability Memory test Delay testing Multiple cell upset MCU Power demand Silicon Flip-flops CMOS VLSI Noise Fault tolerance Microprocessors Through-silicon vias Atmospheric neutrons Automatic test pattern generation Thermal sensor Design Accelerometer Electromagnetic Analysis Field programmable gate arrays Core-cell DPA Delays RSA Heavy ions Logic gates Resistive-open defects Cryptographie Fault injection Sensors FPGA ATPG Magnetic tunneling Design space exploration Radiation Neutrons DFT Reliability Simulation Countermeasures Single Event Upset SER Testing MRAM