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Number of Files
524
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1 163
Collaborations’ map
Tags
Testing
VLSI
Robustness
Integrated circuit design
Radiation
Design space exploration
SER
Hardware security
Automatic test pattern generation
Test
Single event upset SEU
Analytical models
Libraries
FPGA
CMOS integrated circuits
Atmospheric neutrons
Voltage
Magnetic tunneling
Through-silicon vias
Security
Embedded systems
Power demand
Cryptography
ATPG
Electromagnetic Analysis
Integrated circuit modeling
Integrated circuit testing
Thermal sensor
Diagnostic
Computer architecture
Flip-flops
Calibration
Fiabilité
Switches
Heating
Cryptographie
SEU
Fault attacks
Heavy ions
Neutron
Power consumption
Fault tolerance
Multiple cell upset MCU
Design
Failure analysis
Accelerometer
Monitoring
Memory device
RSA
Spintronics
Clocks
DFT
BIST
Memories
DPA
Soft errors
MRAM
Microprocessors
MEMS
SoC
Memory test
Delay testing
Single Event Upset
AES
Field programmable gate arrays
Logic gates
Transistors
Silicon
Accelerometers
Hardware Trojan
Resistive-open defects
Noise
Countermeasures
Random access memory
Variability
Cross section
Reliability
SRAM
Low power
Neutrons
Cross-section
Transient faults
Testability
Circuit faults
Fault modeling
Logic testing
Memory
Simulation
Sensors
Estimation
Circuit testing
Modeling
CMOS
Integrated circuit interconnections
Low-power design
Core-cell
Hardware
Delays
Fault injection
Crosstalk