Testing VLSI Robustness Integrated circuit design Radiation Design space exploration SER Hardware security Automatic test pattern generation Test Single event upset SEU Analytical models Libraries FPGA CMOS integrated circuits Atmospheric neutrons Voltage Magnetic tunneling Through-silicon vias Security Embedded systems Power demand Cryptography ATPG Electromagnetic Analysis Integrated circuit modeling Integrated circuit testing Thermal sensor Diagnostic Computer architecture Flip-flops Calibration Fiabilité Switches Heating Cryptographie SEU Fault attacks Heavy ions Neutron Power consumption Fault tolerance Multiple cell upset MCU Design Failure analysis Accelerometer Monitoring Memory device RSA Spintronics Clocks DFT BIST Memories DPA Soft errors MRAM Microprocessors MEMS SoC Memory test Delay testing Single Event Upset AES Field programmable gate arrays Logic gates Transistors Silicon Accelerometers Hardware Trojan Resistive-open defects Noise Countermeasures Random access memory Variability Cross section Reliability SRAM Low power Neutrons Cross-section Transient faults Testability Circuit faults Fault modeling Logic testing Memory Simulation Sensors Estimation Circuit testing Modeling CMOS Integrated circuit interconnections Low-power design Core-cell Hardware Delays Fault injection Crosstalk