Hardware Computer architecture Memories Flip-flops Power consumption Thermal sensor Through-silicon vias Resistive-open defects Integrated circuit interconnections VLSI Microprocessors ATPG Hardware Trojan SoC FPGA Magnetic tunneling CMOS Spintronics MRAM Failure analysis Single Event Upset Cryptography AES Sensors Low-power design Analytical models Noise Fault injection Neutrons Silicon Switches Electromagnetic Analysis Diagnostic Integrated circuit testing Cross-section RSA Accelerometer MEMS Fault attacks Random access memory Delay testing BIST Reliability Radiation Atmospheric neutrons Logic testing Integrated circuit modeling Countermeasures Neutron CMOS integrated circuits SRAM Design space exploration Calibration Robustness Power demand Delays Sensor Fault modeling DPA DFT Variability Testing Crosstalk Memory test Security Soft errors Core-cell Soft Error Rate Libraries Temperature distribution Fiabilité Cryptographie Transistors Test Memory device Cross section Monitoring Circuit faults Transient faults Design Integrated circuit design Simulation Embedded systems SER Heating SEU Multiple cell upset MCU Accelerometers Clocks Heavy ions Hardware security Field programmable gate arrays Fault tolerance Automatic test pattern generation Single event upset SEU Low power Testability Memory Logic gates Modeling