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Number of Files
518
Nomber of Notices
1 170
Collaborations’ map
Tags
Monitoring
MEMS
Variability
Crosstalk
SEU
SoC
Circuit faults
Single event upset SEU
Clocks
3D
Soft errors
Libraries
Accelerometers
Soft Error Rate
CMOS integrated circuits
Random access memory
Embedded systems
Memories
Computer architecture
Security
Sensor
Test
Fiabilité
Cryptography
Heating
Transistors
AES
Fault attacks
Hardware
Hardware Trojan
Hardware security
Failure analysis
Robustness
Logic testing
Low power
Modeling
Integrated circuit testing
Integrated circuit modeling
Integrated circuit design
Transient faults
Cross section
Calibration
Cross-section
Analytical models
Memory device
Switches
Low-power design
BIST
SRAM
Temperature distribution
Memory
Neutron
Integrated circuit interconnections
Diagnostic
Spintronics
Fault modeling
Testability
Memory test
Delay testing
Multiple cell upset MCU
Power demand
Silicon
Flip-flops
CMOS
VLSI
Noise
Fault tolerance
Microprocessors
Through-silicon vias
Atmospheric neutrons
Automatic test pattern generation
Thermal sensor
Design
Accelerometer
Electromagnetic Analysis
Field programmable gate arrays
Core-cell
DPA
Delays
RSA
Heavy ions
Logic gates
Resistive-open defects
Cryptographie
Fault injection
Sensors
FPGA
ATPG
Magnetic tunneling
Design space exploration
Radiation
Neutrons
DFT
Reliability
Simulation
Countermeasures
Single Event Upset
SER
Testing
MRAM