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TEST
Test and dEpendability of microelectronic integrated SysTems
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ISSN
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Contains
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Number of Files
161
Nomber of Notices
292
Collaborations’ map
Tags
Test and Security
ZigBee
Power demand
Single event upset SEU
Power supplies
Logic gates
Testing
Diagnosis
Circuit faults
Laser
Particle detector
Scan Attacks Countermeasure
Integrated circuit testing
Integrated circuits
Alternate testing
Fault attacks
Machine Learning
OQPSK
Transistors
Soft errors
Integrated circuit reliability
Neutrons
Ensemble methods
Diffusion model
Integrated circuit design
Indirect testing
Digital ATE
Process variability
Radiation hardening
Integrated circuit modeling
FDSOI
Computer architecture
One bit acquisition
COTS
3D integration
Hardware Security
Security
Transient faults
Software
Fiabilité
Switches
Analytical models
Fault tolerant systems
Simulation
Machine-learning algorithms
RF test
1-bit acquisition
Power consumption
Approximate Computing
Multiple cell upset MCU
Libraries
Approximate computing
Hardware Trojan
Hardware
Fault injection
Random access memory
SER
BIST
Stream Cipher
Fault tolerance
Education
Phase noise
Context Saving
Through-silicon vias
Radiation
Digital signal processing
Estimation
Transient analysis
Atmospheric neutrons
Scan Encryption
Cross section
RF integrated circuits
Test efficiency
Heavy ions
Protons
Logic testing
Clocks
Memories
SEU
Test
Reliability
Monitoring
Fault simulation
Fault Injection
JTAG
Computational modeling
Noise measurement
Microprocessors
ATPG
Combinational circuits
Automatic test pattern generation
Test cost reduction
Flip-flops
Analog/RF integrated circuits
Delays
SRAM
Analog signals
Soft error
Hardware security
Microprocessor chips