Power supplies Integrated circuit testing SEU RF test Hardware Security Analytical models Heavy ions Approximate computing Machine-learning algorithms Computational modeling Automatic test pattern generation Libraries Monitoring Fault tolerance Transient faults Hardware Trojan Memories OQPSK Fiabilité Logic testing RF integrated circuits Power consumption Analog/RF integrated circuits Flip-flops Integrated circuit modeling Particle detector SER Ensemble methods Multiple cell upset MCU Soft errors Delays Noise measurement Phase noise Cross section Clocks One bit acquisition Combinational circuits Circuit faults Through-silicon vias Fault tolerant systems Microprocessor chips Reliability Hardware security Digital signal processing Random access memory Context Saving Security Logic gates Neutrons Test and Security ATPG Soft error Laser Diffusion model JTAG Test cost reduction Radiation SRAM Simulation Fault injection Integrated circuit reliability Education Alternate testing Protons 1-bit acquisition FDSOI Digital ATE Microprocessors Atmospheric neutrons Fault simulation Power demand Fault attacks Integrated circuits ZigBee Diagnosis Software Test efficiency Scan Encryption Analog signals Test Stream Cipher 3D integration Computer architecture Testing Indirect testing BIST Machine Learning Single event upset SEU COTS Estimation Switches Scan Attacks Countermeasure Process variability Hardware Fault Injection Transistors Approximate Computing Radiation hardening Transient analysis Integrated circuit design