Search

TEST

 Test and dEpendability of microelectronic integrated SysTems

Consult your copyright

 
     

Consulter la politique des éditeurs également sur

Number of Files

94

Nomber of Notices

278

Collaborations’ map

Tags

Clocks Switches Digital ATE FRAM COTS Fault injection 3D integration Atmospheric neutrons Power demand Integrated circuit interconnections Microprocessors Hardware Trojan Detection Intra-cell defect Logic gates Memories SER Light Encryption ATPG Libraries FDSOI Technology Hardware Trojans Heating Integrated circuits Three-dimensional integrated circuits Digital signal processing Diffusion model FDSOI Radiation Transistors Estimation Monitoring Integrated circuit modeling Fault attacks Databases Test and Security Fault diagnosis Design for testability Integrated circuit design Fiabilité Reliability Through-silicon vias Hardware Security Power consumption Microprocessor chips Analog signals Approximate computing Test cost reduction Heavy ions Fault simulation Test efficiency Automatic test pattern generation Indirect testing Analog/RF integrated circuits Evaluation SEU Single event upset SEU Fault tolerance Functional and Structural test Soft errors Three-dimensional displays Fault tolerant systems Transient faults Random access memory Alternate testing Software Multiple cell upset MCU Integrated circuit noise Protons 1-bit acquisition BIST Computer architecture Scan Attacks Countermeasure Testing Hardware Trojan Flip-flops Phase noise Transient analysis Laser Laser fault injection SRAM Hardware Cross section Delays Simulation FDSOI technology Noise measurement Circuit faults Dynamic test Computational modeling Particle detector Test Process variability Logic testing Integrated circuit reliability Integrated circuit testing One bit acquisition Security Hardware security Education Power supplies