The TEST (Test and dEpendability of Integrated Microelectronics SysTems) team’s main objective is the development of models, methods and tools to ensure the post-production quality of integrated microelectronic devices. The team focuses on designing test-ready integrated systems to make post-production verification steps simpler, more efficient and less costly.

Our main contributions harness emerging tech-nologies, as we pay particular attention to complexity, variability and consumption issues, non-monolithic integration approaches with 3D integration technologies, and to novel devices in the development of reliability and test approaches. This research is most often accompanied by the development of new test methods, but also relies on proposing fault models or designing hardware architectures which are integrated into the systems to monitor their performance throughout their life cycle.