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TEST
Test and dEpendability of microelectronic integrated SysTems
Consult your copyright
Titre du journal ou ISSN
Editeur
Number of Files
173
Nomber of Notices
288
Collaborations’ map
Tags
Power supplies
Integrated circuit testing
SEU
RF test
Hardware Security
Analytical models
Heavy ions
Approximate computing
Machine-learning algorithms
Computational modeling
Automatic test pattern generation
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Fault tolerance
Transient faults
Hardware Trojan
Memories
OQPSK
Fiabilité
Logic testing
RF integrated circuits
Power consumption
Analog/RF integrated circuits
Flip-flops
Integrated circuit modeling
Particle detector
SER
Ensemble methods
Multiple cell upset MCU
Soft errors
Delays
Noise measurement
Phase noise
Cross section
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Combinational circuits
Circuit faults
Through-silicon vias
Fault tolerant systems
Microprocessor chips
Reliability
Hardware security
Digital signal processing
Random access memory
Context Saving
Security
Logic gates
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Test and Security
ATPG
Soft error
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JTAG
Test cost reduction
Radiation
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Simulation
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Integrated circuit reliability
Education
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1-bit acquisition
FDSOI
Digital ATE
Microprocessors
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3D integration
Computer architecture
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Process variability
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Transistors
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Radiation hardening
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Integrated circuit design