Neutrons Integrated circuits Reliability Integrated circuit reliability Transistors Laser SER Estimation Particle detector Approximate computing Integrated circuit modeling Logic gates Power demand Microprocessors 1-bit acquisition Indirect test BIST Flip-flops Dynamic test Analog signals Transient analysis Ensemble methods OQPSK Education Protons Machine-learning algorithms Integrated circuit testing Approximate Computing Robustness Indirect testing Analog/RF integrated circuits Neutron Fault simulation Multiple cell upset MCU SEU Hardware security Radiation effects Radiation hardening Logic testing Simulation Digital signal processing Radiation Software Fault tolerance Soft error Hardware Trojan Heavy ions Memories Circuit faults Single event upset SEU IoT FDSOI Silicon One bit acquisition Diagnosis RISC-V Fiabilité Scan Attacks Countermeasure Random access memory Test cost reduction Phase noise Digital ATE Clocks SRAM JTAG Test and Security Test Noise measurement Switches Process variability Testing Hardware Fault Injection Machine Learning Power supplies Fault attacks Latch design RF test ATPG Fault Tolerance Power consumption Fault injection Soft errors Delays Test efficiency Automatic test pattern generation Monitoring Stream Cipher Diffusion model Security Atmospheric neutrons Libraries Computer architecture ZigBee FRAM Integrated circuit design Cross section Radiation testing RF integrated circuits Microprocessor chips