Fault simulation Computer architecture IoT Atmospheric neutrons Microprocessor chips Indirect testing Analog/RF integrated circuits Flip-flops Power supplies Transient analysis Latch design FDSOI Integrated circuit testing Cross section Radiation Hardware security Through-silicon vias OQPSK ATPG Silicon RISC-V JTAG Diagnosis Fault tolerant systems 1-bit acquisition Laser Integrated circuits Noise measurement Fault injection Machine-learning algorithms Monitoring Radiation effects Switches Reliability SEU Power demand Hardware Security Machine Learning Fault Tolerance RF test Approximate computing ZigBee Soft error Digital signal processing Microprocessors Power consumption Security Radiation testing Hardware Trojan Integrated circuit modeling Test efficiency Ensemble methods Approximate Computing Estimation Hardware Particle detector Libraries BIST Radiation hardening Heavy ions Analog signals Fault attacks Fiabilité Diffusion model Simulation Protons SRAM Robustness Integrated circuit design Scan Attacks Countermeasure Software RF integrated circuits Single event upset SEU SER Test cost reduction Phase noise Testing Soft errors Random access memory Digital ATE Logic gates Process variability Fault Injection Automatic test pattern generation Scan Encryption Delays Education Clocks Circuit faults Fault tolerance Integrated circuit reliability Neutrons Logic testing Transistors Multiple cell upset MCU One bit acquisition Stream Cipher Memories Test and Security Test