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TEST
Test and dEpendability of microelectronic integrated SysTems
Consult your copyright
Titre du journal ou ISSN
Editeur
Number of Files
Nomber of Notices
264
Collaborations’ map
Tags
Neutrons
Integrated circuits
Reliability
Integrated circuit reliability
Transistors
Laser
SER
Estimation
Particle detector
Approximate computing
Integrated circuit modeling
Logic gates
Power demand
Microprocessors
1-bit acquisition
Indirect test
BIST
Flip-flops
Dynamic test
Analog signals
Transient analysis
Ensemble methods
OQPSK
Education
Protons
Machine-learning algorithms
Integrated circuit testing
Approximate Computing
Robustness
Indirect testing
Analog/RF integrated circuits
Neutron
Fault simulation
Multiple cell upset MCU
SEU
Hardware security
Radiation effects
Radiation hardening
Logic testing
Simulation
Digital signal processing
Radiation
Software
Fault tolerance
Soft error
Hardware Trojan
Heavy ions
Memories
Circuit faults
Single event upset SEU
IoT
FDSOI
Silicon
One bit acquisition
Diagnosis
RISC-V
Fiabilité
Scan Attacks Countermeasure
Random access memory
Test cost reduction
Phase noise
Digital ATE
Clocks
SRAM
JTAG
Test and Security
Test
Noise measurement
Switches
Process variability
Testing
Hardware
Fault Injection
Machine Learning
Power supplies
Fault attacks
Latch design
RF test
ATPG
Fault Tolerance
Power consumption
Fault injection
Soft errors
Delays
Test efficiency
Automatic test pattern generation
Monitoring
Stream Cipher
Diffusion model
Security
Atmospheric neutrons
Libraries
Computer architecture
ZigBee
FRAM
Integrated circuit design
Cross section
Radiation testing
RF integrated circuits
Microprocessor chips